logo资料库

The_Fundamentals_Of_Digital_Semiconductor_Testing.pdf

发布时间：2022-06-29 发布人：admin 分类：说明书 资料大小：18.38M 资料格式：pdf 举报 版权申诉
第1页 / 共279页
第2页 / 共279页
第3页 / 共279页
第4页 / 共279页
第5页 / 共279页
第6页 / 共279页
第7页 / 共279页
第8页 / 共279页
资料共279页，剩余部分请下载后查看
    The Fundamentals Of Digital Semiconductor Testing
    1: The Basics
    Objectives
    Scientific/Engineering Notation
    Current
    Resistance
    Using Ohms Law to Test Device Specifications
    Digital Numbers
    Digital Logic
    2: Overview of Semiconductors and ATE
    Objectives
    ATE-Automated Test Equipment
    Semiconductor Technologies
    Digital and Analog Circuits
    Type of ATE System
    Tester Loadboards
    Wafer Probng
    Probe Cards
    Device Handlers
    Temperature Forcing Units
    3: Introduction to test
    Objectives
    Basic Terms
    What is The Correct Way to Test
    The Test System
    The PMU
    The Pin Electronics
    Basic Rules of Test Engineering
    4: Device Sepcifications
    Objectives
    Basic Terms
    The Design Specification
    The Test Specifications
    The Device Specification
    Test Conditions and Limits
    Parameters that Apply to Parametric Testing(DC)
    Parameters that Apply to Functional and AC Testing
    Logical Functions
    Reading Device Specifications
    256X4 RAM Specifications
    Interpreting the Device Specification
    Device Specifications and Test Conditions
    5: Open and Sorts - PMU Method
    Objectives
    Why Test for Opens and Shorts?
    Opens and Shorts Serial Static Method
    6: Verifying DC Parameters
    Objectives
    Basic Terms
    Binning
    Program Flow
    Test Summary
    DC Tests and the Hidden Resistance
    Ohm's Law
    VOH/IOH
    VOL/IOL
    IDD Gross Current
    IDD Static Current
    IDD Dynamic Current
    Input Currents (IIL/IIH)
    Resistive Input - Pull-ups and Pull-downs
    Output Fanout
    High Impedance Currents (IOZL/IOZH)
    Input Clamp (VI)
    Output Short Circuit Current (IOS)
    7: Verifying Function Parameters
    Objectives
    Basic Terms
    Functional Testing
    The Test Cycle
    Input Data
    Input Signal Formats
    Developing Input Signal Timings
    Output Data
    Testing Outputs
    Developing Output Signal Timing
    Vector DAta
    Executing a Functional Test
    Functional Specifications
    Gross Functional Tests
    Equation Based Timing
    Functionally Testing a Device
    Sample Device Specification
    Specification Test Conditions for the Clocked Inverter
    Test Program Statements for Clocked Inverter
    Standard Functional Tests
    Opens and Shorts - Functional Method
    VIL/VIH
    VOL/IOL VOH/IOH Functional Test
    Resistive Output Loading
    Functional Z-state - High Impedance Testing
    Open Drain/Open Source Outputs
    8: Testing AC Parameters
    Objectives
    AC parametric Testing
    Raed & Record
    Go-Nogo Testing
    Compromises
    Standard AC Parameters
    Setup Time
    Hold Time
    Propagation Delay Measurements
    Minimum Pulse Widths
    Maximum Frequency
    Output Enable Time
    Output Disable Time
    AC Specifications from 256X4 Static RAM Data Sheet
    Developing functional Timing
    Write Cycle Timing
    Read Cycle Timing
    9: Device Characterization
    Objectives
    Test Vectors and Characterization
    The Binary Search
    Binary Search Test Applications
    The Linear Search
    Common Characterization Paameters
    The Test System Dataloger
    Use of Test System Tools
    Shmoo Plots
    Thrshold/Level Search
    10: Test Vector Development
    Objectives
    Test Vectors
    Example Vector File
    Working with the Design Engineer
    Creating Vectors by Hand
    Tester Options (Memory Considerations)
    Test Vector Examples
    Simulation Data
    Simulation for Test
    11: Test Program Development Issues
    Objectives
    What is the Primary purpose of the Test Program?
    Other Consideration
    Initializing the Program
    Verifying the Test Setup
    Power-on Sequencing
    Power-off Sequencing
    12: Creating a Test Program
    Objectives
    Developing the Test Plan from the Device Specification
    Designing the Test Hardware
    Writing the Test Program
    Loadboard Tests
    Tester Diagnostics
    Running the Program the First Time
    Verifying the Functional Test Setup
    A Brief Discussion on Test Vectors
    13: Troubleshooting
    Objectives
    Introduction
    Where to Begin
    Example: IIL/IIH Test Failures
    Debug Tools
    14: Qualifying and Documenting the Test Program
    Objectives
    Qualification
    Verify testing on handlers and probers
    Documenting the Test Program
    15: CMOS Device LAtch-up
    Objectives
    What is Latch-up?
    Latch-up Testing
    Test Patterns
    Test Procedure Summary
    Applying Test Stimulus
    16: Priciples of Scan Testing
    Objectives
    What is Scan Testing?
    LSSD Technique
    Scan Test Equipment
    Glossary
    Answers to Review Questions
    S3-Introduction to Test
    S4-Workbook Exercise
    S4-Device Specifiction
    S5-Opens and Shorts
    S6-DC Tests
    S7-Functional Test
    S8-AC Testing
    S9-Device Characterization
    S10-Test Vector Development
    S11-Test Program Development issue
    S12-Creating a Test Program
    S13-Troubleshooting
    S14-Qualifying and documenting the Test Program
    分享到：
    赞 收藏

    相关推荐

    资料库

    存储

    共收录294份资料，累计8个分类，关注成员有19位，主要包括：EMC,SUN,IBM,Dell,HP,Microsoft,Veritas,其它

    热门标签

    EMC SUN IBM Dell HP Microsoft Veritas 其它

    最新资料