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TITLE
INTRO
TOC
CH01
CH02
CH03 CPU ARCHITECTURE
CH04 PORT FUNCTIONS
CH05 CLOCK GENERATOR
CH06 TIMER ARRAY UNIT TAUS
CH07
CH08
CH09
CH10
CH11 A/D CONVERTER
CH12-1
CH12-2
CH12-3
CH13
CH14
CH15
CH16
CH17
CH18
CH19
CH20
CH21 OPTION BYTE
CH22
CH23
CH24
CH25 INSTRUCTION SET
CH26
CH27
ADDRESS
Preliminary User’s Manual μPD79F9211 16-bit Single-Chip Microcontrollers Date Published February 2008 NS CP(K) Printed in Japan 2008
[MEMO] 2 Preliminary User’s Manual
NOTES FOR CMOS DEVICES 1 2 3 4 5 6 VOLTAGE APPLICATION WAVEFORM AT INPUT PIN Waveform distortion due to input noise or a reflected wave may cause malfunction. If the input of the CMOS device stays in the area between VIL (MAX) and VIH (MIN) due to noise, etc., the device may malfunction. Take care to prevent chattering noise from entering the device when the input level is fixed, and also in the transition period when the input level passes through the area between VIL (MAX) and VIH (MIN). HANDLING OF UNUSED INPUT PINS Unconnected CMOS device inputs can be cause of malfunction. If an input pin is unconnected, it is possible that an internal input level may be generated due to noise, etc., causing malfunction. CMOS devices behave differently than Bipolar or NMOS devices. Input levels of CMOS devices must be fixed high or low by using pull-up or pull-down circuitry. Each unused pin should be connected to VDD or GND via a resistor if there is a possibility that it will be an output pin. All handling related to unused pins must be judged separately for each device and according to related specifications governing the device. PRECAUTION AGAINST ESD A strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and ultimately degrade the device operation. Steps must be taken to stop generation of static electricity as much as possible, and quickly dissipate it when it has occurred. Environmental control must be adequate. When it is dry, a humidifier should be used. It is recommended to avoid using insulators that easily build up static electricity. Semiconductor devices must be stored and transported in an anti-static container, static shielding bag or conductive material. All test and measurement tools including work benches and floors should be grounded. The operator should be grounded using a wrist strap. Semiconductor devices must not be touched with bare hands. Similar precautions need to be taken for PW boards with mounted semiconductor devices. STATUS BEFORE INITIALIZATION Power-on does not necessarily define the initial status of a MOS device. Immediately after the power source is turned ON, devices with reset functions have not yet been initialized. Hence, power-on does not guarantee output pin levels, I/O settings or contents of registers. A device is not initialized until the reset signal is received. A reset operation must be executed immediately after power-on for devices with reset functions. POWER ON/OFF SEQUENCE In the case of a device that uses different power supplies for the internal operation and external interface, as a rule, switch on the external power supply after switching on the internal power supply. When switching the power supply off, as a rule, switch off the external power supply and then the internal power supply. Use of the reverse power on/off sequences may result in the application of an overvoltage to the internal elements of the device, causing malfunction and degradation of internal elements due to the passage of an abnormal current. The correct power on/off sequence must be judged separately for each device and according to related specifications governing the device. INPUT OF SIGNAL DURING POWER OFF STATE Do not input signals or an I/O pull-up power supply while the device is not powered. The current injection that results from input of such a signal or I/O pull-up power supply may cause malfunction and the abnormal current that passes in the device at this time may cause degradation of internal elements. Input of signals during the power off state must be judged separately for each device and according to related specifications governing the device. Preliminary User’s Manual 3
Windows and Windows NT are registered trademarks or trademarks of Microsoft Corporation in the United States and/or other countries. PC/AT is a trademark of International Business Machines Corporation. EEPROM is a trademark of NEC Electronics Corporation. SuperFlash is a registered trademark of Silicon Storage Technology, Inc. in several countries including the United States and Japan. Caution: This product uses SuperFlash® technology licensed from Silicon Storage Technology, Inc. • • • • • • • The information contained in this document is being issued in advance of the production cycle for the product. The parameters for the product may change before final production or NEC Electronics Corporation, at its own discretion, may withdraw the product prior to its production. Not all products and/or types are available in every country. Please check with an NEC Electronics sales representative for availability and additional information. No part of this document may be copied or reproduced in any form or by any means without the prior written consent of NEC Electronics. NEC Electronics assumes no responsibility for any errors that may appear in this document. NEC Electronics does not assume any liability for infringement of patents, copyrights or other intellectual property rights of third parties by or arising from the use of NEC Electronics products listed in this document or any other liability arising from the use of such products. No license, express, implied or otherwise, is granted under any patents, copyrights or other intellectual property rights of NEC Electronics or others. Descriptions of circuits, software and other related information in this document are provided for illustrative purposes in semiconductor product operation and application examples. The incorporation of these circuits, software and information in the design of a customer's equipment shall be done under the full responsibility of the customer. NEC Electronics assumes no responsibility for any losses incurred by customers or third parties arising from the use of these circuits, software and information. While NEC Electronics endeavors to enhance the quality, reliability and safety of NEC Electronics products, customers agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To minimize risks of damage to property or injury (including death) to persons arising from defects in NEC Electronics products, customers must incorporate sufficient safety measures in their design, such as redundancy, fire-containment and anti-failure features. NEC Electronics products are classified into the following three quality grades: "Standard", "Special" and "Specific". The "Specific" quality grade applies only to NEC Electronics products developed based on a customer-designated "quality assurance program" for a specific application. The recommended applications of an NEC Electronics products depend on its quality grade, as indicated below. Customers must check the quality grade of each NEC Electronics product before using it in a particular application. "Standard": Computers, office equipment, communications equipment, test and measurement equipment, audio and visual equipment, home electronic appliances, machine tools, personal electronic equipment and industrial robots. Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster systems, anti-crime systems, safety equipment and medical equipment (not specifically designed for life support). Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life support systems and medical equipment for life support, etc. "Special": "Specific": The quality grade of NEC Electronics products is "Standard" unless otherwise expressly specified in NEC Electronics data sheets or data books, etc. If customers wish to use NEC Electronics products in applications not intended by NEC Electronics, they must contact an NEC Electronics sales representative in advance to determine NEC Electronics' willingness to support a given application. (Note) (1) (2) 4 "NEC Electronics" as used in this statement means NEC Electronics Corporation and also includes its majority-owned subsidiaries. "NEC Electronics products" means any product developed or manufactured by or for NEC Electronics (as defined above). Preliminary User’s Manual M5D 02. 11-1
INTRODUCTION Readers Purpose Organization How to Read This Manual This manual is intended for user engineers who wish to understand the functions of the μPD79F9211 and design and develop application systems and programs for these devices. The target products are as follows. μPD79F9210, μPD79F9211 This manual is intended to give users an understanding of the functions described in the Organization below. The μPD79F9211 manual is separated into two parts: this manual and the instructions edition (common to the 78K0R Microcontroller Series). μPD79F9211 User’s Manual (This Manual) 78K0R Microcontroller User’s Manual Instructions • Pin functions • Internal block functions • Interrupts • Other on-chip peripheral functions • Electrical specifications (target) • CPU functions • Instruction set • Explanation of each instruction It is assumed that the readers of this manual have general knowledge of electrical engineering, logic circuits, and microcontrollers. • To gain a general understanding of functions: → Read this manual in the order of the CONTENTS. • How to interpret the register format: → For a bit number enclosed in angle brackets, the bit name is defined as a reserved word in the RA78K0R, and is defined as an sfr variable using the #pragma sfr directive in the CC78K0R. • To know details of the 78K0R Series instructions: → Refer to the separate document 78K0R Microcontroller Instructions User’s Manual (U17792E). Preliminary User’s Manual 5
Conventions Related Documents Higher digits on the left and lower digits on the right Data significance: Active low representations: ××× (overscore over pin and signal name) Note: Caution: Remark: Numerical representations: Binary Footnote for item marked with Note in the text Information requiring particular attention Supplementary information Decimal Hexadecimal ...×××× or ××××B ...×××× ...××××H The related documents indicated in this publication may include preliminary versions. However, preliminary versions are not marked as such. Documents Related to Devices μPD79F9211 User’s Manual 78K0R Microcontroller Instructions User’s Manual Document Name Documents Related to Development Tools (Software) (User’s Manuals) Document No. This manual U17792E Document Name Document No. CC78K0R Ver. 1.00 C Compiler RA78K0R Ver. 1.00 Assembler Package SM+ System Simulator PM+ Ver. 6.20 ID78K0R-QB Ver. 3.20 Integrated Debugger Operation Language Operation Language Operation Operation Documents Related to Development Tools (Hardware) (User’s Manuals) Document Name QB-MINI2 On-Chip Debug Emulator with Programming Function QB-78K0RKX3L In-Circuit Emulator Documents Related to Flash Memory Programming Document Name PG-FP4 Flash Memory Programmer User’s Manual PG-FP5 Flash Memory Programmer User’s Manual U17838E U17837E U17836E U17835E U18010E U17990E U17839E Document No. U18371E To be prepared Document No. U15260E U18865E Caution The related documents listed above are subject to change without notice. Be sure to use the latest version of each document when designing. 6 Preliminary User’s Manual
Other Documents Document Name Document No. SEMICONDUCTOR SELECTION GUIDE − Products and Packages − Semiconductor Device Mount Manual Quality Grades on NEC Semiconductor Devices NEC Semiconductor Device Reliability/Quality Control System Guide to Prevent Damage for Semiconductor Devices by Electrostatic Discharge (ESD) X13769X Note C11531E C10983E C11892E Note See the “Semiconductor Device Mount Manual” website (http://www.necel.com/pkg/en/mount/index.html). Caution The related documents listed above are subject to change without notice. Be sure to use the latest version of each document when designing. Preliminary User’s Manual 7
CONTENTS CHAPTER 1 OUTLINE ............................................................................................................................ 18 1.1 Features......................................................................................................................................... 19 1.2 Applications.................................................................................................................................. 20 1.3 Ordering Information.................................................................................................................... 20 1.4 Pin Configuration (Top View) ...................................................................................................... 21 1.5 Block Diagram .............................................................................................................................. 23 1.6 Outline of Functions..................................................................................................................... 24 CHAPTER 2 PIN FUNCTIONS ............................................................................................................... 26 2.1 Pin Function List .......................................................................................................................... 26 2.2 Description of Pin Functions ...................................................................................................... 31 2.2.1 P10 to P13 (port 1)........................................................................................................................... 31 2.2.2 P20 to P27 (port 2)........................................................................................................................... 31 2.2.3 P30 to P32 (port 3)........................................................................................................................... 31 2.2.4 P40 and P41 (port 4)........................................................................................................................ 33 2.2.5 P50 to P52 (port 5)........................................................................................................................... 33 2.2.6 P70 to P75 (port 7)........................................................................................................................... 34 2.2.7 P80 to P83 (port 8)........................................................................................................................... 35 2.2.8 P120 to P124 (port 12)..................................................................................................................... 36 2.2.9 P150 and P151 (port 15).................................................................................................................. 36 2.2.10 AVREF.............................................................................................................................................. 37 2.2.11 AVSS ............................................................................................................................................... 37 2.2.12 RESET ........................................................................................................................................... 37 2.2.13 REGC............................................................................................................................................. 38 2.2.14 VDD ................................................................................................................................................. 38 2.2.15 VSS.................................................................................................................................................. 38 2.2.16 FLMD0 ........................................................................................................................................... 38 2.3 Pin I/O Circuits and Recommended Connection of Unused Pins ........................................... 39 CHAPTER 3 CPU ARCHITECTURE ...................................................................................................... 45 3.1 Memory Space .............................................................................................................................. 45 3.1.1 Internal program memory space ...................................................................................................... 48 3.1.2 Mirror area........................................................................................................................................ 50 3.1.3 Internal data memory space............................................................................................................. 51 3.1.4 Special function register (SFR) area ................................................................................................ 52 8 Preliminary User’s Manual U19120EJ1V0UD
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