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脑电信号检测芯片ADS1299器件手册芯片.pdf

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FEATURES
APPLICATIONS
DESCRIPTION
ABSOLUTE MAXIMUM RATINGS
ELECTRICAL CHARACTERISTICS
THERMAL INFORMATION
PARAMETRIC MEASUREMENT INFORMATION
NOISE MEASUREMENTS
TIMING CHARACTERISTICS
PIN CONFIGURATION
TYPICAL CHARACTERISTICS
OVERVIEW
THEORY OF OPERATION
INPUT MULTIPLEXER
Device Noise Measurements
Test Signals (TestP and TestN)
Temperature Sensor (TempP, TempN)
Supply Measurements (MVDDP, MVDDN)
Lead-Off Excitation Signals (LoffP, LoffN)
Auxiliary Single-Ended Input
ANALOG INPUT
PGA SETTINGS AND INPUT RANGE
Input Common-Mode Range
Input Differential Dynamic Range
ADC ΔΣ Modulator
DIGITAL DECIMATION FILTER
Sinc Filter Stage (sinx / x)
REFERENCE
CLOCK
DATA FORMAT
SPI INTERFACE
Chip Select (CS)
Serial Clock (SCLK)
Data Input (DIN)
Data Output (DOUT)
Data Retrieval
Data Ready (DRDY)
GPIO
Power-Down (PWDN)
Reset (RESET)
START
Settling Time
Continuous Mode
Single-Shot Mode
MULTIPLE DEVICE CONFIGURATION
Standard Mode
Daisy-Chain Mode
SPI COMMAND DEFINITIONS
WAKEUP: Exit STANDBY Mode
STANDBY: Enter STANDBY Mode
RESET: Reset Registers to Default Values
START: Start Conversions
STOP: Stop Conversions
RDATAC: Read Data Continuous
SDATAC: Stop Read Data Continuous
RDATA: Read Data
Sending Multi-Byte Commands
RREG: Read From Register
WREG: Write to Register
REGISTER MAP
User Register Description
EEG-SPECIFIC FUNCTIONS
INPUT MULTIPLEXER (Rerouting the BIAS Drive Signal)
INPUT MULTIPLEXER (Measuring the BIAS Drive Signal)
LEAD-OFF DETECTION
DC Lead-Off
AC Lead-Off (One Time or Periodic)
BIAS LEAD-OFF
BIAS DRIVE (DC BIAS CIRCUIT)
Bias Configuration with Multiple Devices
QUICK-START GUIDE
PCB LAYOUT
Power Supplies and Grounding
Shielding Analog Signal Paths
POWER-UP SEQUENCING
SETTING THE DEVICE FOR BASIC DATA CAPTURE
Lead-Off
Bias Drive
Revision History
www.ti.com SBAS499A –JULY 2012 –REVISED AUGUST 2012 Low-Noise, 8-Channel, 24-Bit Analog Front-End for Biopotential Measurements Check for Samples: ADS1299 ADS1299 systems instrumentation With its high levels of integration and exceptional performance, the ADS1299 enables the creation of scalable medical at significantly reduced size, power, and overall cost. The ADS1299 has a flexible input multiplexer per channel that can be independently connected to the internally-generated signals for test, temperature, and lead-off detection. Additionally, any configuration of input channels can be selected for derivation of the patient bias output signal. The ADS1299 operates at data rates from 250 SPS to 16 kSPS. Lead-off detection can be implemented internal to the device, either with an external pull-up or pull-down resistor or an excitation current sink or source. Multiple ADS1299 devices can be cascaded in high channel count systems in a daisy-chain configuration. The ADS1299 is offered in a TQFP-64 package specified from –40°C to +85°C. 1FEATURES 23• Eight Low-Noise PGAs and Eight High- Resolution Simultaneous-Sampling ADCs • Very Low Input-Referred Noise: 1.0 μVPP (70-Hz BW) • Low Power: 5 mW/channel • Input Bias Current: 300 pA • Data Rate: 250 SPS to 16 kSPS • CMRR: –110 dB • Programmable Gain: 1, 2, 4, 6, 8, 12, or 24 • Unipolar or Bipolar Supplies: – Analog: 4.75 V to 5.25 V – Digital: 1.8 V to 3.6 V • Built-In Bias Drive Amplifier, Lead-Off Detection, Test Signals Internal or External Reference • Built-In Oscillator • • Flexible Power-Down, Standby Mode • Pin-Compatible with the ADS1298IPAG • SPI™-Compatible Serial Interface • Operating Temperature Range: –40°C to +85°C APPLICATIONS • Medical Instrumentation (EEG and ECG) Including: – EEG, Bispectral index (BIS), Evoked audio potential (EAP), Sleep study monitor • High-Precision, Simultaneous, Multichannel Signal Acquisition DESCRIPTION low-noise, multichannel, The ADS1299 (ΔΣ) simultaneous-sampling, (ADC) with a built-in analog-to-digital converter programmable internal reference, and an onboard oscillator. The ADS1299 incorporates all for electroencephalogram (EEG) applications. commonly-required features delta-sigma amplifier (PGA), is a 24-bit, gain 1 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. 2SPI is a trademark of Motorola. 3All other trademarks are the property of their respective owners. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright © 2012, Texas Instruments Incorporated ControlCLKGPIO AND CONTROLOscillatorSPITest Signals andMonitorsSPIPATIENT BIAS AND REFERENCEReferenceREFADC7ADC8ADC1ADC2ADC3ADC4ADC5ADC6A7A8A1A2A3A4A5A6MUXINPUTS¼¼To Channel
ADS1299 SBAS499A –JULY 2012–REVISED AUGUST 2012 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. integrated circuits be handled with ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. FAMILY AND ORDERING INFORMATION(1) PRODUCT PACKAGE OPTION ADS1299IPAG TQFP NUMBER OF CHANNELS 8 ADC RESOLUTION MAXIMUM SAMPLE RATE (kSPS) OPERATING TEMPERATURE RANGE 24 16 –40°C to +85°C (1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the device product folder at www.ti.com. ABSOLUTE MAXIMUM RATINGS(1) Over operating free-air temperature range, unless otherwise noted. AVDD to AVSS DVDD to DGND AVSS to DGND VREF input to AVSS Analog input to AVSS Digital input voltage to DGND Digital output voltage to DGND Momentary Continuous Operating range, TA Storage range, Tstg Maximum junction, TJ Human body model (HBM) JEDEC standard 22, test method A114-C.01, all pins Charged device model (CDM) JEDEC standard 22, test method C101, all pins Electrostatic discharge (ESD) ratings Temperature Input current VALUE –0.3 to +5.5 –0.3 to +3.9 –3 to +0.2 AVSS – 0.3 to AVDD + 0.3 AVSS – 0.3 to AVDD + 0.3 –0.3 to DVDD + 0.3 –0.3 to DVDD + 0.3 100 10 –40 to +85 –60 to +150 +150 ±1000 ±500 UNIT V V V V V V V mA mA °C °C °C V V (1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those specified is not implied. 2 Copyright © 2012, Texas Instruments Incorporated
ADS1299 www.ti.com SBAS499A –JULY 2012 –REVISED AUGUST 2012 ELECTRICAL CHARACTERISTICS Minimum and maximum specifications apply from –40°C to +85°C. Typical specifications are at +25°C. All specifications are at DVDD = 3.3 V, AVDD – AVSS = 5 V, VREF = 4.5 V, external fCLK = 2.048 MHz, data rate = 250 SPS, and gain = 12, unless otherwise noted. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT ADS1299 ANALOG INPUTS Full-scale differential input voltage (AINP – AINN) Input common-mode range Ci IIB Input capacitance Input bias current DC input impedance PGA PERFORMANCE Gain settings Bandwidth BW ADC PERFORMANCE Resolution TA = +25°C, input = 2.5 V TA = –40°C to +85°C, input = 2.5 V No lead-off Current source lead-off detection (ILEADOFF = 6 nA) Data rate DR CHANNEL PERFORMANCE (DC Performance) fCLK = 2.048 MHz Input-referred noise (0.01 Hz to 70 Hz) INL EO EG Integral nonlinearity Offset error Offset error drift Gain error Gain drift Gain match between channels CHANNEL PERFORMANCE (AC Performance) CMRR Common-mode rejection ratio PSRR Power-supply rejection ratio Crosstalk SNR THD Signal-to-noise ratio Total harmonic distortion 10 seconds of data, gain = 24 (1) 250 points, 1 second of data, gain = 24, TA = +25°C 250 points, 1 second of data, gain = 24, TA = –40°C to +85°C All other sample rates and gain settings Full-scale with gain = 12, best fit Excluding voltage reference error Excluding voltage reference drift fCM = 50 Hz and 60 Hz (2) fPS = 50 Hz and 60 Hz fIN = 50 Hz and 60 Hz VIN = –2 dBFs, fIN = 10-Hz input, gain = 12 VIN = –0.5 dBFs, fIN = 10 Hz –110 ±VREF / gain See the Input Common-Mode Range subsection of the PGA Settings and Input Range section 20 ±300 500 1000 1, 2, 4, 6, 8, 12, 24 See Table 5 24 250 1.0 1.0 1.0 See Noise Measurements section ±300 16000 1.35 1.6 ±0.5 8 60 80 0.1 3 0.2 –120 96 –110 121 –99 V pF pA pA MΩ MΩ Bits SPS μVPP μVPP μVPP ppm μV nV/°C % of FS ppm/°C % of FS dB dB dB dB dB (1) Noise data measured in a 10-second interval. Test not performed in production. Input-referred noise is calculated with the input shorted (without electrode resistance) over a 10-second interval. (2) CMRR is measured with a common-mode signal of AVSS + 0.3 V to AVDD – 0.3 V. The values indicated are the minimum of the eight channels. Copyright © 2012, Texas Instruments Incorporated 3
ADS1299 SBAS499A –JULY 2012–REVISED AUGUST 2012 www.ti.com ELECTRICAL CHARACTERISTICS (continued) Minimum and maximum specifications apply from –40°C to +85°C. Typical specifications are at +25°C. All specifications are at DVDD = 3.3 V, AVDD – AVSS = 5 V, VREF = 4.5 V, external fCLK = 2.048 MHz, data rate = 250 SPS, and gain = 12, unless otherwise noted. PARAMETER TEST CONDITIONS MIN PATIENT BIAS AMPLIFIER Integrated noise GBP SR THD CMIR ISC Gain bandwidth product Slew rate Total harmonic distortion Common-mode input range Short-circuit current Quiescent power consumption LEAD-OFF DETECT BW = 150 Hz 50 kΩ || 10 pF load, gain = 1 50 kΩ || 10 pF load, gain = 1 fIN = 10 Hz, gain = 1 AVSS + 0.3 ADS1299 TYP 2 100 0.07 –80 1.1 20 Frequency Current Current accuracy Comparator threshold accuracy Continuous One time or periodic ILEAD_OFF[1:0] = 00 ILEAD_OFF[1:0] = 01 ILEAD_OFF[1:0] = 10 ILEAD_OFF[1:0] = 11 EXTERNAL REFERENCE VI(ref) VREFN Negative input Reference input voltage VREFP Positive input Input impedance INTERNAL REFERENCE Output voltage VO VREF accuracy Drift Start-up time SYSTEM MONITORS 5-V supply, VREF = (VREFP – VREFN) TA = –40°C to +85°C Analog supply Digital supply Reading error Device wake up Temperature sensor reading Voltage Coefficient From power-up to DRDY low STANDBY mode TA = +25°C 0, fDR / 4 See Register Map section for settings 7.8, 31.2 6 24 6 24 ±20 ±30 4.5 AVSS AVSS + 4.5 5.6 4.5 ±0.2 35 150 2 2 150 31.25 145 490 Signal frequency See Register Map section for settings Test signal Signal voltage See Register Map section for settings Accuracy fCLK / 221, fCLK / 220 ±1, ±2 ±2 MAX UNIT AVDD – 0.3 μVRMS kHz V/μs dB V mA μA Hz Hz nA nA μA μA % mV V V V kΩ V % ppm ms % % ms µs mV μV/°C Hz mV % 4 Copyright © 2012, Texas Instruments Incorporated
ADS1299 www.ti.com SBAS499A –JULY 2012 –REVISED AUGUST 2012 ELECTRICAL CHARACTERISTICS (continued) Minimum and maximum specifications apply from –40°C to +85°C. Typical specifications are at +25°C. All specifications are at DVDD = 3.3 V, AVDD – AVSS = 5 V, VREF = 4.5 V, external fCLK = 2.048 MHz, data rate = 250 SPS, and gain = 12, unless otherwise noted. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT ADS1299 CLOCK Internal oscillator clock frequency Internal clock accuracy Internal oscillator start-up time Internal oscillator power consumption Nominal frequency TA = +25°C –40°C ≤ TA ≤ +85°C External clock input frequency CLKSEL pin = 0 Logic level, input voltage DIGITAL INPUT/OUTPUT (DVDD = 1.8 V to 3.6 V) VIH VIL VOH VOL IIN POWER-SUPPLY REQUIREMENTS Logic level, output voltage Input current High Low High Low Analog supply (AVDD – AVSS) DVDD Digital supply AVDD – DVDD SUPPLY CURRENT (Bias Turned Off) IAVDD Normal mode IDVDD IOH = –500 μA IOL = +500 μA 0 V < VDigitalInput < DVDD AVDD – AVSS = 5 V DVDD = 3.3 V DVDD = 1.8 V POWER DISSIPATION (Analog Supply = 5 V, Bias Amplifiers Turned Off) Quiescent power dissipation Normal mode Power-down Standby mode, internal reference Quiescent power dissipation, per channel Normal mode TEMPERATURE Temperature range Specified Operating Storage THERMAL INFORMATION THERMAL METRIC(1) θJA θJCtop θJB ψJT ψJB θJCbot Junction-to-ambient thermal resistance Junction-to-case (top) thermal resistance Junction-to-board thermal resistance Junction-to-top characterization parameter Junction-to-board characterization parameter Junction-to-case (bottom) thermal resistance 1.5 0.8 DVDD –0.1 0.9 DVDD –10 4.75 1.8 –2.1 –40 –40 –60 MHz % % μs μW MHz V V V V μA V V V mA mA mA mW μW mW mW °C °C °C UNITS °C/W 2.048 20 120 2.048 5 1.8 7.14 1 0.5 39 10 5.1 4.3 ±0.5 ±2.5 2.25 DVDD + 0.1 0.2 DVDD 0.1 DVDD +10 5.25 3.6 3.6 42 +85 +85 +150 ADS1299 PAG 64 PINS 43.3 36.5 60.6 0.1 19.5 n/a (1) For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953. Copyright © 2012, Texas Instruments Incorporated Submit Documentation Feedback 5 Product Folder Link(s): ADS1299
ADS1299 SBAS499A –JULY 2012–REVISED AUGUST 2012 www.ti.com PARAMETRIC MEASUREMENT INFORMATION NOISE MEASUREMENTS The ADS1299 noise performance can be optimized by adjusting the data rate and PGA setting. When averaging is increased by reducing the data rate, the noise drops correspondingly. Increasing the PGA value reduces the input-referred noise, which is particularly useful when measuring low-level biopotential signals. Table 1 to Table 4 summarize the ADS1299 noise performance with a 5-V analog power supply. The data are representative of typical noise performance at TA = +25°C. The data shown are the result of averaging the readings from multiple devices and are measured with the inputs shorted together. A minimum of 1000 consecutive readings are used to calculate the RMS and peak-to-peak noise for each reading. For the lower data rates, the ratio is approximately 6.6. Table 1 shows measurements taken with an internal reference. The data are also representative of the ADS1299 noise performance when using a low-noise external reference such as the REF5025. Table 1. Input-Referred Noise (μVRMS / μVPP) in Normal Mode 5-V Analog Supply and 4.5-V Reference(1) DR BITS OF CONFIG1 REGISTER 000 001 010 011 100 101 110 111 OUTPUT DATA RATE (SPS) –3-dB BANDWIDTH (Hz) 16000 8000 4000 2000 1000 500 250 n/a 4193 2096 1048 524 262 131 65 n/a PGA GAIN = 1 SNR (dB) 103.3 113.2 117.3 120.3 123.3 126.3 129.3 — NOISE- FREE BITS 15.85 17.50 18.18 18.68 19.18 19.68 20.18 — μVRMS 21.70 6.93 4.33 3.06 2.17 1.53 1.08 — μVPP 151.89 48.53 30.34 21.45 15.17 10.73 7.59 — ENOB 17.16 18.81 19.49 19.99 20.49 20.99 21.48 — μVRMS 10.85 3.65 2.28 1.61 1.14 0.81 0.57 — μVPP 75.94 25.52 15.95 11.29 7.98 5.65 3.99 — PGA GAIN = 2 SNR (dB) 103.3 112.8 116.9 119.9 122.9 125.9 128.9 — (1) At least 1000 consecutive readings were used to calculate the RMS and peak-to-peak noise values in this table. Table 2. Input-Referred Noise (μVRMS / μVPP) in Normal Mode 5-V Analog Supply and 4.5-V Reference(1) DR BITS OF CONFIG1 REGISTER 000 001 010 011 100 101 110 111 OUTPUT DATA RATE (SPS) –3-dB BANDWIDTH (Hz) 16000 8000 4000 2000 1000 500 250 n/a 4193 2096 1048 524 262 131 65 n/a PGA GAIN = 4 SNR (dB) 103.0 112.1 116.1 119.2 122.2 125.2 128.2 — NOISE- FREE BITS 15.81 17.31 17.99 18.49 18.99 19.49 19.99 — μVRMS 5.60 1.98 1.24 0.88 0.62 0.44 0.31 — μVPP 39.23 13.87 8.66 6.13 4.34 3.07 2.16 — ENOB 17.12 18.62 19.29 19.79 20.29 20.79 21.30 — μVRMS 3.87 1.31 0.93 0.66 0.46 0.33 0.23 — μVPP 27.10 9.19 6.50 4.60 3.25 2.30 1.62 — PGA GAIN = 6 SNR (dB) 102.7 112.1 115.1 118.1 121.1 124.1 127.2 — NOISE- FREE BITS 15.85 17.43 18.11 18.60 19.10 19.60 20.10 — NOISE- FREE BITS 15.76 17.32 17.82 18.32 18.81 19.31 19.82 — ENOB 17.16 18.74 19.41 19.91 20.41 20.91 21.41 — ENOB 17.06 18.62 19.12 19.62 20.12 20.62 21.13 — (1) At least 1000 consecutive readings were used to calculate the RMS and peak-to-peak noise values in this table. 6 Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated Product Folder Link(s): ADS1299
www.ti.com SBAS499A –JULY 2012 –REVISED AUGUST 2012 Table 3. Input-Referred Noise (μVRMS / μVPP) in Normal Mode 5-V Analog Supply and 4.5-V Reference(1) ADS1299 DR BITS OF CONFIG1 REGISTER 000 001 010 011 100 101 110 111 OUTPUT DATA RATE (SPS) –3-dB BANDWIDTH (Hz) 16000 8000 4000 2000 1000 500 250 n/a 4193 2096 1048 524 262 131 65 n/a PGA GAIN = 8 SNR (dB) 102.3 111.0 114.0 117.1 120.1 123.1 126.1 — NOISE- FREE BITS 15.69 17.14 17.64 18.14 18.64 19.14 19.64 — μVRMS 3.05 1.11 0.79 0.56 0.39 0.28 0.20 — μVPP 21.32 7.80 5.52 3.90 2.76 1.95 1.38 — ENOB 16.99 18.45 18.95 19.44 19.94 20.44 20.95 — μVRMS 2.27 0.92 0.65 0.46 0.32 0.23 0.16 — μVPP 15.89 6.41 4.53 3.20 2.26 1.61 1.13 — PGA GAIN = 12 SNR (dB) 101.3 109.2 112.2 115.2 118.3 121.2 124.3 — NOISE- FREE BITS 15.53 16.84 17.34 17.84 18.34 18.83 19.34 — ENOB 16.83 18.14 18.64 19.14 19.65 20.14 20.65 — (1) At least 1000 consecutive readings were used to calculate the RMS and peak-to-peak noise values in this table. Table 4. Input-Referred Noise (μVRMS / μVPP) in Normal Mode 5-V Analog Supply and 4.5-V Reference(1) DR BITS OF CONFIG1 REGISTER 000 001 010 011 100 101 110 111 OUTPUT DATA RATE (SPS) –3-dB BANDWIDTH (Hz) 16000 8000 4000 2000 1000 500 250 n/a 4193 2096 1048 524 262 131 65 n/a PGA GAIN = 24 SNR (dB) 98.0 104.4 107.4 110.4 113.5 116.5 119.5 — NOISE- FREE BITS 14.98 16.04 16.54 17.04 17.54 18.04 18.54 — ENOB 16.28 17.35 17.84 18.35 18.85 19.35 19.85 — μVRMS 1.66 0.80 0.56 0.40 0.28 0.20 0.14 — μVPP 11.64 5.57 3.94 2.79 1.97 1.39 0.98 — (1) At least 1000 consecutive readings were used to calculate the RMS and peak-to-peak noise values in this table. Copyright © 2012, Texas Instruments Incorporated Submit Documentation Feedback 7 Product Folder Link(s): ADS1299
ADS1299 SBAS499A –JULY 2012–REVISED AUGUST 2012 TIMING CHARACTERISTICS www.ti.com NOTE: SPI settings are CPOL = 0 and CPHA = 1. Figure 1. Serial Interface Timing Figure 2. Daisy-Chain Interface Timing Timing Requirements For Figure 1 and Figure 2(1) DESCRIPTION PARAMETER tCLK tCSSC tSCLK tSPWH, L tDIST tDIHD tDOHD tDOPD tCSH tCSDOD tSCCS tSDECODE tCSDOZ tDISCK2ST tDISCK2HT (1) Specifications apply from –40°C to +85°C. Load on DOUT = 20 pF || 100 kΩ. Master clock period CS low to first SCLK, setup time SCLK period SCLK pulse width, high and low DIN valid to SCLK falling edge: setup time Valid DIN after SCLK falling edge: hold time SCLK falling edge to invalid DOUT: hold time SCLK rising edge to DOUT valid: setup time CS high pulse CS low to DOUT driven Eighth SCLK falling edge to CS high Command decode time CS high to DOUT Hi-Z Valid DAISY_IN to SCLK rising edge: setup time Valid DAISY_IN after SCLK rising edge: hold time 2.7 V ≤ DVDD ≤ 3.6 V TYP MAX 666 MIN 444 6 50 15 10 10 10 666 1.8 V ≤ DVDD ≤ 2 V MIN 444 17 66.6 25 10 11 10 TYP MAX UNIT ns ns ns ns ns ns ns ns tCLKs ns tCLKs tCLKs ns ns ns 2 10 4 4 10 10 17 10 2 20 4 4 10 10 32 20 8 Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated Product Folder Link(s): ADS1299 DISY_INADOUTSCLKMSBD1tDISCK2STMSB213216217218MSBD1LSBtDISCK2HTLSBD12191CSSCLKDINDOUT2381283tCSSCtDISTtDIHDtDOHDtCSHtDOPDtSPWHtSPWLtSCCSHi-ZtCSDOZtCSDODHi-ZtSCLKtSDECODECLKtCLK
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