LIN_Conformance_Test_Spec_2

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LIN Conformance Test Specification Package for LIN 2.1 October 10th, 2008 LIN Conformance Test Specification Package for LIN 2.1 For the LIN Specification Package Revision 2.1 (November 24th, 2006) October 10th, 2008 © LIN Consortium, 2008 This specification as released by the LIN Consortium is intended for the purpose of information only and is provided on an "AS IS" basis only and cannot be the basis for any claims. The LIN Consortium will not be liable for any use of this Specification. This Document must be regarded as strictly LIN Consortium Internal and must not be distributed outside the LIN Consortium. The use is restricted for the assignee, his col- leagues, and employees of any affiliates of his company. The unauthorized use, e.g. copying, displaying or other use of any content from this document is a violation of the law and intellectual property rights. LIN is a registered Trademark ®. All rights reserved. All distributions are registered. Website: www.lin-subbus.org Contact: info@lin-subbus.org i m o c . c m e t @ s u a s e i l . k n a r f r o f y p o c d e r e t s g e R i

LIN Conformance Test Specification Package for LIN 2.1 October 10th, 2008 i m o c . c m e t @ s u a s e i l . k n a r f r o f y p o c d e r e t s g e R i Website: www.lin-subbus.org Contact: info@lin-subbus.org

LIN Conformance Test Specification OSI Layer 1 – Physical Layer Version 2.1 October 10th, 2008; Page 1 LIN Conformance Test Specification LIN OSI Layer 1 – Physical Layer For LIN devices with Rx and Tx access For the LIN Physical Layer Specification Revision 2.1 (November 24th, 2006) Version 2.1 October 10th, 2008 i m o c . c m e t @ s u a s e i l . k n a r f r o f y p o c d e r e t s g e R i Website: www.lin-subbus.org Contact: info@lin-subbus.org

Table of Contents LIN Conformance Test Specification OSI Layer 1 – Physical Layer Version 2.1 October 10th, 2008; Page 2 Table of contents LIN OSI LAYER 1 – PHYSICAL LAYER TEST SPECIFICATION OVERVIEW 1 3 1.1 Test Case Organisation......................................................................................................... 3 1.2 Symbols and Abbreviated Terms .......................................................................................... 4 1.3 Measurement and Signal Generation – Requirements ......................................................... 4 OPERATIONAL CONDITIONS – CALIBRATION 5 2.1 Operating Voltage Range ...................................................................................................... 6 2.2 Threshold Voltages................................................................................................................ 7 2.2.1 IUT as Receiver: VSUP @ VBUS_DOM (down)......................................................................................................... 7 2.2.2 IUT as Receiver: VSUP @VBUS_ REC (up) .............................................................................................................. 8 2.2.3 IUT as Receiver: VSUP @VBUS............................................................................................................................. 9 2.3 Variation of VSUP_NON_OP ∈ [- 0.3V ... 7.0V], [18V … 40V].................................................... 10 2.4 IBUS Under Several Conditions............................................................................................. 11 2.4.1 IBUS_LIM @ Dominant State ( Driver On )............................................................................................................ 11 2.4.2 IBUS_PAS_dom : IUT in Recessive State : VBUS = 0V............................................................................................... 12 2.4.3 IBUS_PAS_rec : IUT in Recessive State : VSUP = 7.0V with Variation of VBUS ∈ [8.0V .. 18V].................................... 13 2.5 Slope Control....................................................................................................................... 14 2.5.1 Measuring the Duty Cycle @ 10.4 kBit/sec – IUT as Transmitter ..................................................................... 14 2.5.2 Measuring the Duty Cycle @ 20.0 kBit/sec – IUT as Transmitter ..................................................................... 16 2.6 Propagation Delay ............................................................................................................... 18 2.6.1 Propagation Delay of the Receiver................................................................................................................... 18 2.7 GND / VBAT Shift Test – Dynamic ........................................................................................ 19 2.7.1 GND Shift Test – Dynamic – IUT as Transceiver ............................................................................................. 20 2.7.2 GND Shift Test – Dynamic – IUT as Transceiver ............................................................................................. 20 2.7.3 VBAT Shift Test – Dynamic – IUT as Transceiver............................................................................................... 21 2.7.4 VBAT Shift Test – Dynamic – IUT as Transceiver............................................................................................... 21 2.8 Failure.................................................................................................................................. 22 2.8.1 Loss of Battery................................................................................................................................................. 22 2.8.2 Loss of GND .................................................................................................................................................... 23 STATIC TEST CASES REFERENCES 24 27 Website: www.lin-subbus.org Contact: info@lin-subbus.org i m o c . c m e t @ s u a s e i l . k n a r f r o f y p o c d e r e t s g e R i 1 2 3 4

Test Specification overview LIN Conformance Test Specification OSI Layer 1 – Physical Layer Version 2.1 October 10th, 2008; Page 3 1 Test Specification overview 1.1 Test Case Organisation The intention of each test case is described at first, with a short textual explanation. Before tests are executed the test system must be set to its initial state as described in chap- ter 2. The test procedure and the expected results are described in the form of a chart for each test case. The table below is a typical test description. IUT node as Test for master, slave or both Corresponding test number Initial State Test Steps Parameters: Number of nodes Bus loads Operational Conditions: IUT Mode TX Signal RX Signal VBAT,VSUP,VIUT Failure GND Shift Describe the test stages. Number of node in the test implementation In order to simulate a LIN network Operation Mode for the IUT (e.g. normal mode, low power mode,...) State of TX pin at the beginning of the test Logical output voltages of the Rx pin corresponding to reces- sive/dominant level at the LIN pin are taken from the data sheet of the IUT. Value in Volt In order to set failure at Value in Volt Response Describe the result expected in order to decide if the test passed or failed Reference Corresponding no. in the LIN Physical Layer Specification Remark: IUT can be a master or slave ECU or an individual transceiver chip. The Rx, Tx and VSUP signals must be accessible for proper test execution. It is recommended to test with Rx/Tx access, if not possible testing according the specification without Rx/Tx access is accepted. Depending on the type of IUT the supply voltage is VBAT for ECU or VSUP for a chip – called VIUT in this description. i m o c . c m e t @ s u a s e i l . k n a r f r o f y p o c d e r e t s g e R i Website: www.lin-subbus.org Contact: info@lin-subbus.org

Test Specification overview LIN Conformance Test Specification OSI Layer 1 – Physical Layer Version 2.1 October 10th, 2008; Page 4 1.2 Symbols and Abbreviated Terms IUT Implementation under Test Tx Rx TRX VBAT VSUP VIUT VBUS Tx pin of the transceiver Rx pin of the transceiver Transceiver Voltage at ECU supply pins Voltage at transceiver supply pins Voltage at IUT supply pins Voltage on the LIN bus LIN Bus LIN network GND Ground 1.3 Measurement and Signal Generation – Requirements Signal Generation: Rise / Fall Time Signal Measurement: Dynamic Signals: Frequency Jitter < 20ns (Square Wave) < 40ns (Triangle) 20ppm < 25ns Oscilloscope 100MHz Rise Time ≤ 3,5ns Power Supply (VCC, VIUT, VLIN) Static Signals: DC Voltage 0,5% DC Current 0,6% 0,5% Resistance 10mV / 1mA Resolution 0,2% of value Accuracy Website: www.lin-subbus.org Contact: info@lin-subbus.org i m o c . c m e t @ s u a s e i l . k n a r f r o f y p o c d e r e t s g e R i

Operational Conditions – Calibration LIN Conformance Test Specification OSI Layer 1 – Physical Layer Version 2.1 October 10th, 2008; Page 5 2 Operational Conditions – Calibration (Electrical input/output, LIN Protocol) The initial configuration for each test case is defined here. Any requirements for individual tests are specified with the test case. Initial State Parameters: Number of nodes Bus loads Operational Conditions: IUT Mode TX Signal 1 - set to normal / active mode Recessive VBAT, VSUP,VIUT Specified for each test Failure GND Shift No failure 0V i m o c . c m e t @ s u a s e i l . k n a r f r o f y p o c d e r e t s g e R i Website: www.lin-subbus.org Contact: info@lin-subbus.org

Operational Conditions – Calibration LIN Conformance Test Specification OSI Layer 1 – Physical Layer Version 2.1 October 10th, 2008; Page 6 2.1 Operating Voltage Range This test shall ensure the correct operation in the valid supply voltage ranges, by correct reception of dominant bits. The IUT is therefore supplied with an increasing/decreasing voltage ramp. Test Configuration: Remote-Controlled Power Supply VIUT Implementation Under Test LIN Pulse Generator RX TX GND Measurement Schematic 1 IUT node as Master and slave ECU Test case 2.1.x (2 cases) Transceiver Parameter VSUP / VBAT See Table 2.1 Test Steps A voltage ramp is set on the VSUP / VBAT as defined on Table 2.1. The LIN signal is driven with a 10kHz rectangular signal with a duty cycle of 50% and a voltage swing of 18V. The IUT must be in operational / active mode Response The RX pin of the IUT has to show the 10kHz signal. A maximum deviation of 10% (time, voltage) is allowed. trigger point delta t = +/ - 5 µs ( t bit = 50 µs ) 2 * t bit = 100 µs ( 20 kBaud ) Reference LIN Physical Layer Specification, Rev. 2.1, Ref. 6.5.4 Param 9, Param 10 # test 2.1.1 2.1.2 VSUP Range / VBAT Range Signal Ramp [7.0V…18V] / [8.0V…18V] [18V…7.0V] / [18V…8.0V] 0.1V/s 0.1V/s Table 2.1 Website: www.lin-subbus.org Contact: info@lin-subbus.org i m o c . c m e t @ s u a s e i l . k n a r f r o f y p o c d e r e t s g e R i

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