logo资料库

Digital Communications Test and Measurement.pdf

发布时间：2022-06-08 发布人：admin 分类：说明书 资料大小：23.90M 资料格式：pdf 举报 版权申诉
第1页 / 共852页
第2页 / 共852页
第3页 / 共852页
第4页 / 共852页
第5页 / 共852页
第6页 / 共852页
第7页 / 共852页
第8页 / 共852页
资料共852页，剩余部分请下载后查看
    Front-cover
    Copyright
    Prentice Hall Modern Semiconductor Design Series
    Preface
    About the Authors
    Acknowledgments
    Table of Contents
    Chapter 1. Fundamentals of Digital Communications Systems
    1.1. Introduction
    1.2. System Architectures
    1.3. Line Coding of Digital Signals
    1.4. Electrical Signaling
    1.5. Summary
    1.6. References
    Chapter 2. Jitter Basics
    2.1. Definition of Jitter
    2.2. Jitter as a Statistical Phenomenon
    2.3. Total Jitter and Its Subcomponents
    2.4. Analytical Solutions for Jitter Mixtures
    2.5. The Dual Dirac Model
    2.6. Summary
    2.7. References
    Chapter 3. Serial Communication Systems and Modulation Codes
    3.1. Introduction
    3.2. Encoders and Modulation Code Examples
    3.3. Telephone System History and Evolution
    3.4. SONET Design Requirements
    3.5. Measuring the Band-Pass Response
    3.6. Jitter
    3.7. Measuring Power Supply Noise Immunity
    3.8. Power Supply Distribution, Grounding, and Shielding
    3.9. Measuring SONET Jitter
    3.10. Modulation Codes for the Last Mile
    3.11. Gigabit Ethernet
    3.12. Summary
    3.13. References
    Chapter 4. Bit Error Ratio Testing
    4.1. Basics of Bit Error Ratio Testing
    4.2. Bit Error Ratio Statistics
    4.3. Advanced BER Measurement Topics
    4.4. Summary
    4.5. References
    Chapter 5. BERT Scan Measurements
    5.1. Basics of BERT Scan Measurements
    5.2. Sample Delay Scan
    5.3. Sample Threshold Scan
    5.4. Full Eye Scan
    5.5. Spectral Jitter Decomposition
    5.6. Summary
    5.7. References
    Chapter 6. Waveform Analysis—Real-Time Scopes
    6.1. Principles of Operation of Real-Time Digital Oscilloscopes
    6.2. Eye Diagram Analysis on Real-Time Instruments
    6.3. Methods of Analyzing Individual Jitter Components
    6.4. Analysis of Composite Jitter
    6.5. Measurement Procedures
    6.6. Interpreting Jitter Measurement Results
    6.7. Summary
    6.8. References
    Chapter 7. Characterizing High-Speed Digital Communications Signals and Systems with the Equivalent-Time Sampling Oscilloscope
    7.1. Sampling Oscilloscope Basics
    7.2. Triggering the Oscilloscope
    7.3. Oscilloscope Bandwidth and Sample Rate
    7.4. Waveform Acquisition Process for the Sampling Oscilloscope
    7.5. Sources of Instrumentation Noise
    7.6. Parametric Analysis of Waveforms
    7.7. The Effect of Oscilloscope Bandwidth on Waveform Results
    7.8. Measurements of the Eye Diagram
    7.9. Return-to-Zero Signals
    7.10. Advanced Jitter Analysis
    7.11. Summary
    7.12. References
    Chapter 8. High-Speed Waveform Analysis Using All-Optical Sampling
    8.1. Introduction
    8.2. Principles of Optical Sampling
    8.3. Performance Measures of All-Optical Sampling Systems
    8.4. Timebase Designs
    8.5. Experimental Implementation and Key Building Blocks
    8.6. Related Applications and Possible Future Directions
    8.7. Summary
    8.8. References
    Chapter 9. Clock Synthesis, Phase Locked Loops, and Clock Recovery
    9.1. Oscillators and Phase Noise
    9.2. Phase Locked Loops and Clock Synthesis
    9.3. Clock Data Recovery Circuits
    9.4. PLL and Clock Recovery Dynamic Behavior
    9.5. Measuring PLL Dynamics
    9.6. Measuring Phase Noise and Jitter Spectrum
    9.7. Summary
    9.8. References
    Chapter 10. Jitter Tolerance Testing
    10.1. Introduction
    10.2. Jitter Tolerance: Basic Measurement Method and Test Setup
    10.3. Generation of Jitter Tolerance Test Signals
    10.4. Jitter Tolerance Measurement Method and Test Setup
    10.5. Summary
    10.6. References
    Chapter 11. Sensitivity Testing in Optical Digital Communications
    11.1. Introduction: Optical Digital Receivers
    11.2. The Basics of Optical Sensitivity Measurements
    11.3. BER Calculations in Real Communications Systems
    11.4. Summary
    11.5. References
    Chapter 12. Stress Tests in High-Speed Serial Links
    12.1. The Need for High-Speed Serial Communication
    12.2. Early High-Speed Optical Stressed-Eye Tests
    12.3. BER versus OSNR
    12.4. 10 Gigabit Ethernet: IEEE 802.3ae
    12.5. The Advent of Electronic Dispersion Compensation
    12.6. LRM Stress Testing (IEEE 802.3aq)
    12.7. Future Standards
    12.8. Summary
    12.9. References
    Chapter 13. Measurements on Interconnects
    13.1. Measurements and Characterization of Interconnects
    13.2. Modeling of System Performance from Measurements
    13.3. Summary
    13.4. References
    Chapter 14. Frequency Domain Measurements
    14.1. Introduction
    14.2. Understanding Network Analyzer Hardware
    14.3. Understanding S-Parameters
    14.4. Error Correction and Calibration Methods
    14.5. Graphical Representations
    14.6. Example Devices
    14.7. Summary
    14.8. References
    Chapter 15. Jitter and Signaling Testing for Chip-to-Chip Link Components and Systems
    15.1. Introduction
    15.2. Multiple Gigabit per Second Computer Chip-to-Chip I/O Link Architectures
    15.3. Chip-to-Chip Link System BER and Signaling Tests
    15.4. Testing Examples
    15.5. Future Technology Trends for High-Speed Links
    15.6. Summary
    15.7. References
    Appendix A. Pseudo-Random Binary Sequences
    A.1. Introduction
    A.2. Linear Feedback Shift Register Implementation
    A.3. Properties of PRBS Sequences
    A.4. PRBS-Based Test Patterns
    A.5. Standardized PRBSs for Communication System Testing
    A.6. Applications
    A.7. References
    Appendix B. Passive Elements for Test Setups
    B.1. Introduction
    B.2. Fixed Step Attenuators
    B.3. Power Splitters and Dividers
    B.4. Variable Delay Lines
    B.5. Filters and Transition Time Converters
    B.6. DC Blocks and Bias Ts
    Appendix C. Coaxial Cables and Connectors
    C.1. Electrical Properties of Coaxial Structures
    C.2. Coaxial Cables
    C.3. Coaxial Connectors
    C.4. References
    Appendix D. Supplemental Materials for Chapter 3
    D.1. 8B10B Encoding Rules
    D.2. Laser Power Controllers and Encoder Run Limits
    D.3. AC Coupling Network Equations and Characteristics
    D.4. Band-Pass Response of the Laser Transmitter
    D.5. Characteristics of Power Supply Noise Test Systems
    Index
    SYMBOL
    A
    B
    C
    D
    E
    F
    G
    H
    I
    J
    K
    L
    M
    N
    O
    P
    Q
    R
    S
    T
    U
    V
    W
    X
    Z
    User name: CSU San Diego Book: Digital Communications Test and Measurement: High-Speed Physical Layer Characterization No part of any chapter or book may be reproduced or transmitted in any form by any means without the prior written permission for reprints and excerpts from the publisher of the book or chapter. Redistribution or other use that violates the fair use privilege under U.S. copyright laws (see 17 USC107) or that otherwise violates these Terms of Service is strictly prohibited. Violators will be prosecuted to the full extent of U.S. Federal and Massachusetts laws. Wireless Networking Dennis Derickson Marcus Müller Prentice Hall Digital Communications Test and Measurement: High-Speed Physical Layer Characterization Copyright Dennis Derickson, California Polytechnic State University Marcus Müller, Agilent Technologies Ransom Stephens, www.ransomnotes.com James Prettyleaf, Finisar Mark Guenther, Tektronix Kalev Sepp, Tektronix Kan Tan, Tektronix Greg LeCheminant, Agilent Technologies Peter Andrekson, Chalmers University of Technology Mathias Westlund, Chalmers University of Technology Jim Stimple, Agilent Technologies Michael Fleischer-Reumann, Agilent Technologies Ernest Bergmann, Circadiant Systems Joey Thompson, Circadiant Systems Eugene Mayevskiy, Tektronix Dimitry Smolyanskiy, Tektronix Doug Yates, Agilent Technologies Mike Li, Altera Corporation Rainer Plitschka, Agilent Technologies Many of the designations used by manufacturers and sellers to distinguish their products are claimed as trademarks. Where those designations appear in this book, and the publisher was aware of a trademark claim, the designations have been printed with initial capital letters or in all capitals. The authors and publisher have taken care in the preparation of this book, but make no expressed or implied warranty of any kind and assume no responsibility for errors or omissions. No liability is assumed for incidental or consequential damages in connection with or arising out of the use of the information or programs contained herein. The publisher offers excellent discounts on this book when ordered in quantity for bulk purchases or special sales, which may include electronic versions and/or custom covers and content particular to your business, training goals, marketing focus, and branding interests. For more information, please contact: U.S. Corporate and Government Sales (800) 382-3419 corpsales@pearsontechgroup.com For sales outside the United States please contact: International Sales international@pearsoned.com Visit us on the Web: www.prenhallprofessional.com
    Library of Congress Cataloging-in-Publication Data Derickson, Dennis. Digital communications test and measurement : high-speed physical layer characterization / Dennis Derickson and Marcus Müller. p. cm. Includes bibliographical references and index. ISBN-13: 978-0-13-220910-6 (hardcover : alk. paper) 1. Digital communications—Measurement . I. Muller, Marcus. II. Title. TK5103.7.D465 2007 621.382—dc22 2007033849 Copyright © 2008 Pearson Education, Inc. All rights reserved. Printed in the United States of America. This publication is protected by copyright, and permission must be obtained from the publisher prior to any prohibited reproduction, storage in a retrieval system, or transmission in any form or by any means, electronic, mechanical, photocopying, recording, or likewise. For information regarding permissions, write to: Pearson Education, Inc. Rights and Contracts Department 501 Boylston Street, Suite 900 Boston, MA 02116 Fax: (617) 671-3447 Editor-in-Chief: Mark Taub Acquisitions Editor: Bernard Goodwin Managing Editor: John Fuller Project Editor: Lara Wysong Copy Editor: Chrysta Meadowbrooke Indexer:The CIP Group Proofreader: Linda Begley Composition: The CIP Group ISBN-13: 978-0-13-220910-6 Text printed in the United States on recycled paper at Courier in Westford, Massachusetts. First printing, December 2007 Dedication The authors would like to acknowledge the support and love of their close friends and family: Sara, Dagmar, Sigrid, Gudrun, James, Ella, Sabine, Gerda, Peter, Lina, Tim, Heather, Karen, Mom, Stacy, Uncle Sherman, Claudette, Catherine Michelle, Lynsley, Matthias, Janne, Anna-Liisa, Qingdong, Renée, Daniel, Matthew, Stacy, Jalyn, Thomas, Jacob, Merike, Sandra Martin, Jenny, Teresa, Derek, Chelsea, Nolan, Ellen, Ulli, Rita, Jed, Molly, Gus, Finn, Cosmo, Marianne, Dominique, Gabrielle, Marcel, Yelena, Sofiya, Violetta, Mercia, Eric, George, Gordon, Paul, Charlotte, Travis, Amanda, Karma, Mary, Hannelore, Arne, Jan, and Till URL http://access.proquest.safaribooksonline.com/9780132209106/copyrightpg
    User name: CSU San Diego Book: Digital Communications Test and Measurement: High-Speed Physical Layer Characterization No part of any chapter or book may be reproduced or transmitted in any form by any means without the prior written permission for reprints and excerpts from the publisher of the book or chapter. Redistribution or other use that violates the fair use privilege under U.S. copyright laws (see 17 USC107) or that otherwise violates these Terms of Service is strictly prohibited. Violators will be prosecuted to the full extent of U.S. Federal and Massachusetts laws. Wireless Networking Dennis Derickson Marcus Müller Prentice Hall Digital Communications Test and Measurement: High-Speed Physical Layer Characterization Prentice Hall Modern Semiconductor Design Series James R. Armstrong and F. Gail Gray VHDL Design Representation and Synthesis Mark Gordon Arnold Verilog Digital Computer Design: Algorithms into Hardware Jayaram Bhasker A VHDL Primer, Third Edition Mark D. Birnbaum Essential Electronic Design Automation (EDA) Eric Bogatin Signal Integrity: Simplified Douglas Brooks Signal Integrity Issues and Printed Circuit Board Design Ken Coffman Real World FPGA Design with Verilog Alfred Crouch Design-for-Test for Digital IC's and Embedded Core Systems Dennis Derickson and Marcus Muller (Editors) Digital Communications Test and Measurement GregEdlund Timing Analysis and Simulation for Signal Integrity Engineers Daniel P. Foty MOSFET Modeling with SPICE: Principles and Practice Tom Granberg Handbook of Digital Techniques for High-Speed Design Nigel Horspool and Peter Gorman The ASIC Handbook William K. Lam Hardware Design Verification: Simulation and Formal Method-Based Approaches Mike Peng Li Jitter, Noise, and Signal Integrity at High-Speed Farzad Nekoogar and Faranak Nekoogar From ASICs to SOCs: A Practical Approach
    Farzad Nekoogar Timing Verification of Application-Specific Integrated Circuits (ASICs) Samir Palnitkar Design Verification with David Pellerin and Scott Thibault Practical FPGA Programming in C Christopher T.Robertson Printed Circuit Board Designer's Reference: Basics Chris Rowen Engineering the Complex SOC Madhavan Swaminathan and A. Ege Engin Power Integrity Modeling and Design for Semiconductors and Systems Wayne Wolf FPGA-Based System Design Wayne Wolf Modern VLSI Design: System-on-Chip Design, Third Edition Bob Zeidman Verilog Designer's Library URL http://access.proquest.safaribooksonline.com/9780132209106/pref01
    User name: CSU San Diego Book: Digital Communications Test and Measurement: High-Speed Physical Layer Characterization No part of any chapter or book may be reproduced or transmitted in any form by any means without the prior written permission for reprints and excerpts from the publisher of the book or chapter. Redistribution or other use that violates the fair use privilege under U.S. copyright laws (see 17 USC107) or that otherwise violates these Terms of Service is strictly prohibited. Violators will be prosecuted to the full extent of U.S. Federal and Massachusetts laws. Wireless Networking Dennis Derickson Marcus Müller Prentice Hall Digital Communications Test and Measurement: High-Speed Physical Layer Characterization Preface Purpose of the Book An example of a digital communications link is an integrated circuit (IC) sending binary-level data to another receiving IC through a microstrip transmission line trace in an FR4 printed circuit board environment. At low data rates that do not challenge the performance edge of communication components, designs are robust. At data rates of 10 Gbit/s (now common in the industry), interrelated design issues in the transmitter, the communication channel, and the receiver become more pronounced. The engineering design effort in the area of high-speed digital links has been extensive. A field called signal integrity has been identified to help high-speed digital designers understand high-frequency design issues. The ultimate goal is to require fewer design cycles during product development. There are many excellent books in the area of signal integrity for digital communications systems (see the References section in Chapter 1 for a listing of recommended books). This book tackles one important subset of this broad signal integrity field: test and measurement techniques, especially for very high speed systems. It focuses on descriptions of test instrumentation hardware, theory of operation, and applications to digital communications links. The topic of jitter in digital systems is covered extensively. The primary topics for high-speed physical layer characterization are the following: Bit error ratio measurement High-speed digital waveform analysis Jitter in digital data streams Receiver testing Characterization of the physical interconnection structures It became clear to the authors of this book that there was not a good single source of reference information on the topic of digital communications test and measurement for the physical layer, and thus this book came into existence. The work combines the collective experience of authors from leading test and measurement organizations (Agilent, Circadiant, and Tektronix), component manufacturers, and university settings. The material in this book has been developed from application notes, seminars, conference presentations, short courses, and unpublished works from the last ten years. Test and measurement equipment companies as well as semiconductor manufacturers and even standards committees are producing a steady stream of application notes on selected high-speed digital test and measurement topics. These notes are often product oriented, and one must draw from a large number of sources to piece together a cohesive coverage of the topic. Much of the material has not had wide circulation to date. A trusted reference has been missing, and this work intends to fill this gap. This book takes the expertise gathered by test and measurement authors that was previously scattered in many places and puts it under a single cover. This book will be useful for technicians, engineers, and scientists who are involved in the digital communications industry or need to learn about it. The book is designed to address the needs of people new to the field and those intimately familiar with it. Digital communications engineers and technicians spend a good fraction of their lives characterizing their system, subsystem, and component performance. This book serves as a reference that adds cohesion to the wide range of topics that must be understood to succeed in
    system characterization. The coverage emphasizes an understanding of how the digital system works, how the test and measurement system is connected, and how an instrument does its job. Understanding instrument architectures and operation gives additional insight on limitations and flexibility of the measurements that can be performed. The book also provides insight into the characteristics of the devices under test. Illustrations are intentionally numerous because the authors believe that visual communication of information is how many people receive information most efficiently. Organization of Contents The book is organized around the architecture of a simple digital communications link consisting of a transmitter, a receiver, and a channel. Chapters 1–3 give an introduction that provides background needed to understand later chapters in the book. Chapters 4–8 cover transmitter testing, Chapters 9–12 cover receiver testing, and Chapters 13–15 address characterization of the communication channel and internal computer communications links. Introduction Chapters Chapters 1–3 provide a general introduction to digital communications and digital communications systems. These chapters offer a series of definitions, concept descriptions, and specific examples of digital communications link topics. They serve as a foundation for understanding the test and measurement chapters that follow. Chapter 1 (general introduction): This chapter gives an overview of high-speed digital communications systems. The goal is to set a framework for the more detailed chapters that follow. This chapter also introduces terminology used in the rest of the book. Chapter 2 (jitter introduction): Jitter is a pressing design problem in high-speed systems. This topic has also seen a large development effort by test and measurement companies in the last five years. Jitter is an extensive subject area and deserves its own introduction. Chapter 3 (communications link examples): This chapter provides specific discussions on selected serial digital communications links. One often needs to understand some detail of the higher-level system definition and performance even when testing is done on the physical layer. Transmitter Characterization Chapters Chapters 4–8 address the characterization of the transmitter portion of a digital communications link. Chapter 4 (bit error ratio testing): A fundamental property of a digital communications link is the bit error ratio (BER), which is the number of bit errors divided by the total number of bits sent. This chapter along with Appendix A provides a detailed description of the test hardware and test methodology for BER. Chapter 5 (bit error ratio scanning): This chapter describes techniques to find the system bit error ratio as a function of the digital decision threshold settings in time and voltage. One can obtain information on the signal-to-noise margin that is present in a digital link by scanning the decision thresholds. This can be very time consuming, and considerable discussion is given on performing measurement scans in a reasonable time period. Chapter 6 (real-time oscilloscopes): This chapter covers high-speed waveform measurements based on real-time oscilloscope architectures. Here very fast analog-to-digital converters (now up to 40 GSamples/s) provide time snapshots of digital waveform segments. Advanced jitter measurement capabilities are described in detail. Chapter 7 (equivalent-time sampling oscilloscopes): Very high speed waveforms can be reconstructed by a sampling process where data points are taken less frequently compared to real-time oscilloscopes. The sampling architectures and unique instrument capabilities are discussed in detail in this chapter. Finally, applications in digital waveform analysis and jitter component decomposition are given. Chapter 8 (all-optical sampling oscilloscopes): This chapter departs from the earlier ones in that it concentrates on forward- looking optical sampling techniques that will allow viewing of high-speed optical signals such as 40 Gbit/s data streams with high sensitivity and waveform fidelity. Test and measurement equipment with several hundred gigahertz of bandwidth is now becoming available. Receiver Characterization Chapters Chapters 9–12 highlight concepts and measurements for the receiver in a digital communications link.
    Chapter 9 (digital clocks, clock recovery, and phase locked loops): This chapter first outlines the characteristics of oscillators used as reference clocks in digital systems. It then analyzes clock recovery circuits using phase locked loops. Finally, this chapter gives the critical measurement parameters used to characterize clock recovery circuits. Chapter 10 (receiver jitter tolerance characterization): This chapter covers the basic hardware, test methods, and setup for characterizing the jitter tolerance performance for receivers. Chapter 11 (digital optical receiver sensitivity testing): This chapter develops topics related to the testing of digital optical receivers. It addresses uncertainty values in the bit error ratio measurement and gives data-plotting strategies. Chapter 12 (stressed receiver testing): Standards groups have specified that receivers be tested with controlled signal degradations. This stressed testing method allows the receiver to be characterized in a more realistic signal environment. Channel and System Characterization Chapters Chapters 13 and 14 highlight test techniques for the interconnecting transmission line structures for digital links. Both frequency domain and time domain characterization techniques are given. Chapter 15 covers the specific topic of link characterization for internal computer communication functions. Chapter 13 (time domain reflectometry [TDR] and time domain transmission [TDT]): This chapter covers time domain methods for characterizing the propagation of a signal from the transmitter to the receiver. Step-by-step analysis techniques are given to interpret TDR/TDT displays. Advanced measurement software can also be used to create a discontinuity model for the channel. Chapter 14 (frequency domain measurements): Frequency domain techniques can be used to obtain the same information as traditional TDRs/TDTs with several other modes of operation. This method is contrasted against the direct time domain measurements discussed in Chapter 13. Several examples of measurement applications are given. Chapter 15 (communications links inside the PC computer architecture): This chapter outlines operation and test strategies for PCI Express, SATA, and FBDIMM communications links internal to the computer. Appendixes Appendix A covers the topic of pseudo-random binary sequences (PRBSs) in detail. Appendix B outlines several connector types used in high-frequency testing. Appendix C covers several accessory components that are often used in high-speed digital testing. Appendix D gives very detailed coverage for topics introduced in Chapter 3. Final Comments As you browse through the book, we anticipate that you will find graphics that will draw you into several sections of the book's discussion. Many of the test and measurement issues discussed in this book are a direct result of Gb/s signals being routed around systems in less than ideal signal environments. It is still hard to believe that digital designs with 10 Gbit/s circuitry are being fabricated on FR4 printed circuit boards with good success. The on-off signal waveforms are digital in nature, but it is quite easy to have these transmitted bits become nearly unrecognizable at the receiver. The authors have strived to provide a valuable reference in high-speed physical layer characterization of these digital signals. Dennis Derickson, editor Marcus Müller, editor URL http://access.proquest.safaribooksonline.com/9780132209106/pref02
    分享到：
    赞 收藏

    相关推荐

    资料库

    课程资源

    共收录17145份资料，累计13个分类，关注成员有19位，主要包括：PHP,网络管理,网页制作,Java,.Net,数据库,3G/移动开发,C/C++,游戏开发,嵌入式,讲义,软件测试,专业指导

    热门标签

    PHP 网络管理 网页制作 Java .Net 数据库 3G/移动开发 C/C++ 游戏开发 嵌入式 讲义 软件测试 专业指导

    最新资料