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                                                          編號:               
                                                         日期: 94 年 7 月21 日 
 
    客戶:   
 
A2V64S40CTP----G6PP       
    品名:               A2V64S40CTP
G6PP        
A2V64S40CTP
A2V64S40CTP
G6PP       
G6PP       
 
                  台康資訊股份有限公司   
樣品生產廠商 :  (PSC) 
 
 
樣品承認簽章處: 
        業務:    陳志強        
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
64Mb SDRAM Specification
A2V64S40CTP
No.12, Li-Hsin Rd.1, Science-based Industrial Park, Hsin-Chu
Taiwan,  R.O.C.
TEL: 886-3-5795000
FAX: 886-3-5792168
Powerchip  Semiconductor  Corporation 
A2V64S40CTP   
64M Single Data Rate Synchronous DRAM 
 
 
General Description 
The A2V64S40CTP is 67,108,864 bits synchronous high data rate Dynamic RAM organized as 4 x 1,048,576 words by 
16 bits. Synchronous design allows precise cycle controls with the use of system clock I/O transactions are possible on 
every clock cycle. Range of operating frequencies, programmable burst length and programmable latencies allow the same 
device to be useful for a variety of high bandwidth, high performance memory system applications. 
 
Features 
•    3.3V power supply 
 
•    LVTTL compatible with multiplexed address   
•    Four banks operation 
 
 
•    MRS cycle with address key programs   
 
 
 
- CAS latency (2 & 3)  
 
- Burst length (1, 2, 4, 8 & Full page)   
 
- Burst type (Sequential & Interleave)  
 
 
 
•    All inputs are sampled at the positive going   
      edge of the system clock 
•    Auto & self refresh 
•    64ms refresh period (4K cycle) 
•    Burst read single write operation 
•    LDQM & UDQM for masking 
 
 
Ordering Information: 
 
 
 
 
 
 
 
 
 
 
 
 
Pin Configurations 
 
 
 
 
 
 
 
 
 
 
 
 
 
Package 
400mil 
TSOP-2 
400mil 
TSOP-2 
400mil 
TSOP-2 
400mil 
TSOP-2 
Frequency  Speed(ns) 
Order Part Number 
Type 
Standard  Pb-Free 
200MHZ 
166MHZ 
143MHZ 
133MHZ 
5 
6 
7 
A2V64S40CTP 
A2V64S40CTP 
A2V64S40CTP 
-5 
-6 
-7 
-G5 
-G6 
-G7 
7.5 
A2V64S40CTP 
-75 
-G75 
 
 
 
 
 
 
Revision 1.0                                                  Page 1/38                                                March, 2005 
 
Powerchip  Semiconductor  Corporation 
A2V64S40CTP   
64M Single Data Rate Synchronous DRAM 
 
DESCRIPTION 
 
 
Clock: CLK is driven by the system clock. All SDRAM input signals are sampled on the positive 
edge of CLK. CLK also increments the internal burst counter and controls the output registers. 
 
Clock  Enable:  CKE  activates  (HIGH)  and  deactivates  (LOW)  the  CLK  signal.  Deactivating  the 
clock  provides  PRECHARGE  POWER-DOWN  and  SELF  REFRESH  operation  (all  banks  idle), 
ACTIVE  POWER-DOWN  (row  active  in  any  bank),  DEEP  POWER  DOWN  (all  banks  idle),  or 
CLOCK  SUSPEND  operation  (burst/access  in  progress).  CKE  is  synchronous  except  after  the 
device enters power-down and self refresh modes, where CKE becomes asynchronous until after 
exiting the same mode. The input buffers, including CLK, are disabled during power-down and self 
refresh modes, providing low standby power. CKE may be tied HIGH. 
 
Chip  Select:  /CS  enables  (registered  LOW)  and  disables  (registered  HIGH)  the  command 
decoder. All commands are masked when /CS is registered HIGH. /CS provides for external bank 
selection on systems with multiple banks. /CS is considered part of the command code. 
 
Command Inputs: /CAS, /RAS, and /WE (along with /CS) define the command being entered. 
 
Input/Output Mask: DQM is sampled HIGH and is an input mask signal for write accesses and an 
output enable signal for read accesses. Input data is masked during a WRITE cycle. The output 
buffers are placed in a High-Z state (two-clock latency) when during a READ cycle. LDQM 
corresponds to DQ0–DQ7, UDQM corresponds to DQ8–DQ15. LDQM and UDQM are considered 
same state when referenced as DQM. 
 
Bank Address Input(s): BA0 and BA1 define to which bank the ACTIVE, READ, WRITE or 
PRECHARGE command is being applied. These pins also select between the mode register and 
the extended mode register. 
 
Address Inputs: A0–A11 are sampled during the ACTIVE command (row address A0–A11) and 
READ/WRITE command (column-address A0–A7; with A10 defining auto precharge) to select one 
location out of the memory array in the respective bank. A10 is sampled during a PRECHARGE 
command to determine if all banks are to be precharged (A10 HIGH) or bank selected by BA0, 
BA1  (LOW).  The  address  inputs  also  provide  the  op-code  during  a  LOAD  MODE  REGISTER 
command. 
 
Data Input/Output: Data bus. 
 
Internally Not Connected: These could be left unconnected, but it is recommended they be 
connected or VSS. 
 
 
Pin Descriptions 
SYMBOL 
TYPE 
CLK 
Input 
CKE 
Input 
/CS 
/CAS, /RAS, 
/WE 
LDQM, 
UDQM, 
Input 
Input 
Input 
BA0, BA1 
Input 
A0–A11 
Input 
I/O 
– 
DQ0–DQ15 
NC 
VDDQ 
VSSQ 
VDD 
VSS 
 
 
Supply  DQ Power: Provide isolated power to DQs for improved noise immunity. 
Supply  DQ Ground: Provide isolated ground to DQs for improved noise immunity. 
Supply  Core Power Supply. 
Supply  Ground. 
 
 
 
Revision 1.0                                                  Page 2/38                                                March, 2005 
 
 
ABSOLUTE MAXIMUM RATINGS 
Powerchip  Semiconductor  Corporation 
A2V64S40CTP   
64M Single Data Rate Synchronous DRAM 
 
Unit 
VIN,VOUT 
Value 
Symbol 
VDD, VDDQ 
Parameter 
Voltage on any pin relative to Vss 
Voltage on VDD supply relative to Vss 
Storage temperature 
Power dissipation 
Short circuit current 
 
NOTES: 
Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are exceeded. 
Functional operation should be restricted to recommended operating condition. 
Exposure to higher than recommended voltage for extended periods of time could affect device reliability. 
 
DC OPERATING CONDITIONS 
Recommended operating conditions (Voltage referenced to VSS = 0V, TA = -25 to 85° C for Extended, 0 to 70° C for Commercial) 
-1.0 ~ 4.6 
-1.0 ~ 4.6 
-55 ~ +150 
V 
° C 
W 
mA 
TSTG 
PD 
IOS 
1.0 
50 
V 
Parameter 
Supply voltage 
Symbol 
VDD 
VDDQ 
Min 
3.0 
3.0 
VIL 
2.4 
2.0 
VIH 
-0.3 
VOH 
Input logic high voltage 
Input logic low voltage 
Output logic high voltage 
Output logic low voltage 
Input leakage current 
Output leakage current 
 
Note:   
1. VIH(max) = 4.6V AC for pulse width ≤ 10ns acceptable. 
2. VIL(min) = -1.5V AC for pulse width ≤ 10ns acceptable. 
3. Any input 0V ≤ VIN ≤ VDD + 0.3V, all other pins are not under test = 0V. 
4. Dout is disabled , 0V ≤ VOUT ≤ VDD. 
 
CAPACITANCE    ( Vdd =3.3V, TA = 23°C, f = 1MHz, Vref = 0.9V ± 50mV) 
VOL 
IoL 
ILI 
- 
-5 
-5 
Typ 
3.3 
3.3 
 
0 
- 
- 
- 
- 
Max 
3.6 
3.6 
VDDQ + 0.3 
0.8 
- 
0.4 
5 
5 
Unit 
Note 
V 
V 
V 
V 
V 
V 
uA 
uA 
 
 
1 
2 
IOH = -0.1mA 
IOL = 0.1mA 
3 
3 
Parameter 
Clock 
/CAS,/RAS,/WE,/CS,CKE,L/UDQM 
Address 
DQ0~DQ15 
 
Symbol 
Cclk 
Cin 
CADD 
COUT 
Min 
2.0 
2.0 
2.0 
3.0 
Max 
4.0 
4.0 
4.0 
6.0 
Unit 
pF 
pF 
pF 
pF 
Note 
 
 
 
 
Revision 1.0                                                  Page 3/38                                                March, 2005 
 
Powerchip  Semiconductor  Corporation 
A2V64S40CTP   
64M Single Data Rate Synchronous DRAM 
 
 
DC CHARACTERISTICS 
Recommended operating conditions (Voltage referenced to VSS = 0V, TA = -25 to 85° C for Extended, 0 to 70° C for Commercial) 
Parameter 
Symbol 
Test Condition 
-5 
Version 
-6 
-7 
-75  Unit  Note 
Operating Current 
(One Bank Active) 
ICC1 
Burst length = 1 
tRC . tRC(min) 
IO = 0 mA 
120 
110 
100 
95 
mA 
1 
Precharge Standby Current in 
power-down mode 
ICC2P 
CKE . VIL(max), tCC = 10ns 
ICC2PS  CKE & CLK . VIL(max), tCC =  ∞ 
2 
1 
2 
1 
2 
1 
2 
1 
Precharge Standby Current 
in non power-down mode 
ICC2N 
CKE . VIH(min), CS . VIH(min), tCC = 10ns 
Input signals are changed one time during 20ns 
20 
20 
20 
20 
ICC2NS  CKE . VIH(min), CLK . VIL(max), tCC =  ∞ 
Input signals are stable 
Active Standby Current 
in power-down mode 
ICC3P 
CKE . VIL(max), tCC = 10ns 
ICC3PS  CKE & CLK . VIL(max), tCC =  ∞ 
15 
10 
10 
15 
10 
10 
15 
10 
10 
15 
10 
10 
Active Standby Current 
in non power-down mode 
(One Bank Active) 
ICC3N 
CKE . VIH(min), CS . VIH(min), tCC = 10ns 
Input signals are changed one time during 20ns 
30 
30 
30 
30 
ICC3NS  CKE . VIH(min), CLK . VIL(max), tCC =  ∞ 
Input signals are stable 
25 
25 
25 
25 
 
 
 
 
 
 
 
mA 
mA 
 
mA 
mA 
160 
150 
140 
130  mA 
1 
180 
180 
180 
180  mA 
1 
1 
1 
1 
mA 
2 
 
Operating Current 
(Burst Mode) 
ICC4 
IO = 0 mA 
Page burst 
4Banks Activated 
tCCD = 2CLKs 
Refresh Current 
ICC5 
tARFC . tARFC(min) 
ICC6 
CKE . 0.2V 
Self Refresh Current 
 
NOTES: 
1. Measured with outputs open. 
2. Refresh period is 64ms. 
3. Unless otherwise noted, input swing IeveI is CMOS(VIH /VIL=VDDQ/VSSQ). 
 
 
 
 
 
 
 
 
Revision 1.0                                                  Page 4/38                                                March, 2005 
 
 
AC OPERATING TEST CONDITIONS(VDD = 3.3V, TA = -25 to 85° C for Extended, 0 to 70° C for Commercial) 
Powerchip  Semiconductor  Corporation 
A2V64S40CTP   
64M Single Data Rate Synchronous DRAM 
 
Parameter 
AC input levels (Vih/Vil) 
Input timing measurement reference level 
Input rise and fall time 
Output timing measurement reference level 
Output load condition 
 
 
 
Value 
2.4 / 0.4 
1.4 
tr/tf = 1/1 
1.4 
See Figure 2 
Unit 
V 
V 
ns 
V 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
Revision 1.0                                                  Page 5/38                                                March, 2005