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DE1板子sdram时序和工作原理说明.pdf

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奇奇奇奇 普普普普 仕仕仕仕 股股股股 份份份份 有有有有 限限限限 公公公公 司司司司 ULTRA SOURCE TECHNOLOGY CORP. LTD. 台 北 縣 ㆗ 和 市 建 ㆒ 路 150150150150 號號號號 17171717 樓樓樓樓 TEL : 886-2-82263168 FAX : 886-2-82263353 台 北 縣 ㆗ 和 市 建 ㆒ 路 台 北 縣 ㆗ 和 市 建 ㆒ 路 台 北 縣 ㆗ 和 市 建 ㆒ 路 17F. NO.150Jian-Yi RD, CHUNG-HO, TAIPEI 235, TAIWAN R.O.C. 積體電路樣品承認書 ` . 編號: 日期: 94 年 7 月21 日 客戶: A2V64S40CTP----G6PP 品名: A2V64S40CTP G6PP A2V64S40CTP A2V64S40CTP G6PP G6PP 台康資訊股份有限公司 樣品生產廠商 : (PSC) 樣品承認簽章處: 業務: 陳志強
64Mb SDRAM Specification A2V64S40CTP No.12, Li-Hsin Rd.1, Science-based Industrial Park, Hsin-Chu Taiwan, R.O.C. TEL: 886-3-5795000 FAX: 886-3-5792168
Powerchip Semiconductor Corporation A2V64S40CTP 64M Single Data Rate Synchronous DRAM General Description The A2V64S40CTP is 67,108,864 bits synchronous high data rate Dynamic RAM organized as 4 x 1,048,576 words by 16 bits. Synchronous design allows precise cycle controls with the use of system clock I/O transactions are possible on every clock cycle. Range of operating frequencies, programmable burst length and programmable latencies allow the same device to be useful for a variety of high bandwidth, high performance memory system applications. Features • 3.3V power supply • LVTTL compatible with multiplexed address • Four banks operation • MRS cycle with address key programs - CAS latency (2 & 3) - Burst length (1, 2, 4, 8 & Full page) - Burst type (Sequential & Interleave) • All inputs are sampled at the positive going edge of the system clock • Auto & self refresh • 64ms refresh period (4K cycle) • Burst read single write operation • LDQM & UDQM for masking Ordering Information: Pin Configurations Package 400mil TSOP-2 400mil TSOP-2 400mil TSOP-2 400mil TSOP-2 Frequency Speed(ns) Order Part Number Type Standard Pb-Free 200MHZ 166MHZ 143MHZ 133MHZ 5 6 7 A2V64S40CTP A2V64S40CTP A2V64S40CTP -5 -6 -7 -G5 -G6 -G7 7.5 A2V64S40CTP -75 -G75 Revision 1.0 Page 1/38 March, 2005
Powerchip Semiconductor Corporation A2V64S40CTP 64M Single Data Rate Synchronous DRAM DESCRIPTION Clock: CLK is driven by the system clock. All SDRAM input signals are sampled on the positive edge of CLK. CLK also increments the internal burst counter and controls the output registers. Clock Enable: CKE activates (HIGH) and deactivates (LOW) the CLK signal. Deactivating the clock provides PRECHARGE POWER-DOWN and SELF REFRESH operation (all banks idle), ACTIVE POWER-DOWN (row active in any bank), DEEP POWER DOWN (all banks idle), or CLOCK SUSPEND operation (burst/access in progress). CKE is synchronous except after the device enters power-down and self refresh modes, where CKE becomes asynchronous until after exiting the same mode. The input buffers, including CLK, are disabled during power-down and self refresh modes, providing low standby power. CKE may be tied HIGH. Chip Select: /CS enables (registered LOW) and disables (registered HIGH) the command decoder. All commands are masked when /CS is registered HIGH. /CS provides for external bank selection on systems with multiple banks. /CS is considered part of the command code. Command Inputs: /CAS, /RAS, and /WE (along with /CS) define the command being entered. Input/Output Mask: DQM is sampled HIGH and is an input mask signal for write accesses and an output enable signal for read accesses. Input data is masked during a WRITE cycle. The output buffers are placed in a High-Z state (two-clock latency) when during a READ cycle. LDQM corresponds to DQ0–DQ7, UDQM corresponds to DQ8–DQ15. LDQM and UDQM are considered same state when referenced as DQM. Bank Address Input(s): BA0 and BA1 define to which bank the ACTIVE, READ, WRITE or PRECHARGE command is being applied. These pins also select between the mode register and the extended mode register. Address Inputs: A0–A11 are sampled during the ACTIVE command (row address A0–A11) and READ/WRITE command (column-address A0–A7; with A10 defining auto precharge) to select one location out of the memory array in the respective bank. A10 is sampled during a PRECHARGE command to determine if all banks are to be precharged (A10 HIGH) or bank selected by BA0, BA1 (LOW). The address inputs also provide the op-code during a LOAD MODE REGISTER command. Data Input/Output: Data bus. Internally Not Connected: These could be left unconnected, but it is recommended they be connected or VSS. Pin Descriptions SYMBOL TYPE CLK Input CKE Input /CS /CAS, /RAS, /WE LDQM, UDQM, Input Input Input BA0, BA1 Input A0–A11 Input I/O – DQ0–DQ15 NC VDDQ VSSQ VDD VSS Supply DQ Power: Provide isolated power to DQs for improved noise immunity. Supply DQ Ground: Provide isolated ground to DQs for improved noise immunity. Supply Core Power Supply. Supply Ground. Revision 1.0 Page 2/38 March, 2005
ABSOLUTE MAXIMUM RATINGS Powerchip Semiconductor Corporation A2V64S40CTP 64M Single Data Rate Synchronous DRAM Unit VIN,VOUT Value Symbol VDD, VDDQ Parameter Voltage on any pin relative to Vss Voltage on VDD supply relative to Vss Storage temperature Power dissipation Short circuit current NOTES: Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are exceeded. Functional operation should be restricted to recommended operating condition. Exposure to higher than recommended voltage for extended periods of time could affect device reliability. DC OPERATING CONDITIONS Recommended operating conditions (Voltage referenced to VSS = 0V, TA = -25 to 85° C for Extended, 0 to 70° C for Commercial) -1.0 ~ 4.6 -1.0 ~ 4.6 -55 ~ +150 V ° C W mA TSTG PD IOS 1.0 50 V Parameter Supply voltage Symbol VDD VDDQ Min 3.0 3.0 VIL 2.4 2.0 VIH -0.3 VOH Input logic high voltage Input logic low voltage Output logic high voltage Output logic low voltage Input leakage current Output leakage current Note: 1. VIH(max) = 4.6V AC for pulse width ≤ 10ns acceptable. 2. VIL(min) = -1.5V AC for pulse width ≤ 10ns acceptable. 3. Any input 0V ≤ VIN ≤ VDD + 0.3V, all other pins are not under test = 0V. 4. Dout is disabled , 0V ≤ VOUT ≤ VDD. CAPACITANCE ( Vdd =3.3V, TA = 23°C, f = 1MHz, Vref = 0.9V ± 50mV) VOL IoL ILI - -5 -5 Typ 3.3 3.3 0 - - - - Max 3.6 3.6 VDDQ + 0.3 0.8 - 0.4 5 5 Unit Note V V V V V V uA uA 1 2 IOH = -0.1mA IOL = 0.1mA 3 3 Parameter Clock /CAS,/RAS,/WE,/CS,CKE,L/UDQM Address DQ0~DQ15 Symbol Cclk Cin CADD COUT Min 2.0 2.0 2.0 3.0 Max 4.0 4.0 4.0 6.0 Unit pF pF pF pF Note Revision 1.0 Page 3/38 March, 2005
Powerchip Semiconductor Corporation A2V64S40CTP 64M Single Data Rate Synchronous DRAM DC CHARACTERISTICS Recommended operating conditions (Voltage referenced to VSS = 0V, TA = -25 to 85° C for Extended, 0 to 70° C for Commercial) Parameter Symbol Test Condition -5 Version -6 -7 -75 Unit Note Operating Current (One Bank Active) ICC1 Burst length = 1 tRC . tRC(min) IO = 0 mA 120 110 100 95 mA 1 Precharge Standby Current in power-down mode ICC2P CKE . VIL(max), tCC = 10ns ICC2PS CKE & CLK . VIL(max), tCC = ∞ 2 1 2 1 2 1 2 1 Precharge Standby Current in non power-down mode ICC2N CKE . VIH(min), CS . VIH(min), tCC = 10ns Input signals are changed one time during 20ns 20 20 20 20 ICC2NS CKE . VIH(min), CLK . VIL(max), tCC = ∞ Input signals are stable Active Standby Current in power-down mode ICC3P CKE . VIL(max), tCC = 10ns ICC3PS CKE & CLK . VIL(max), tCC = ∞ 15 10 10 15 10 10 15 10 10 15 10 10 Active Standby Current in non power-down mode (One Bank Active) ICC3N CKE . VIH(min), CS . VIH(min), tCC = 10ns Input signals are changed one time during 20ns 30 30 30 30 ICC3NS CKE . VIH(min), CLK . VIL(max), tCC = ∞ Input signals are stable 25 25 25 25 mA mA mA mA 160 150 140 130 mA 1 180 180 180 180 mA 1 1 1 1 mA 2 Operating Current (Burst Mode) ICC4 IO = 0 mA Page burst 4Banks Activated tCCD = 2CLKs Refresh Current ICC5 tARFC . tARFC(min) ICC6 CKE . 0.2V Self Refresh Current NOTES: 1. Measured with outputs open. 2. Refresh period is 64ms. 3. Unless otherwise noted, input swing IeveI is CMOS(VIH /VIL=VDDQ/VSSQ). Revision 1.0 Page 4/38 March, 2005
AC OPERATING TEST CONDITIONS(VDD = 3.3V, TA = -25 to 85° C for Extended, 0 to 70° C for Commercial) Powerchip Semiconductor Corporation A2V64S40CTP 64M Single Data Rate Synchronous DRAM Parameter AC input levels (Vih/Vil) Input timing measurement reference level Input rise and fall time Output timing measurement reference level Output load condition Value 2.4 / 0.4 1.4 tr/tf = 1/1 1.4 See Figure 2 Unit V V ns V Revision 1.0 Page 5/38 March, 2005
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