IEEE Standard for Access and control【IEEE1687-2004】.pdf

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IEEE Std 1687-2014 Front cover

Important Notices and Disclaimers Concerning IEEE Standards Documents

Participants

Introduction

Contents

IMPORTANT NOTICE

1. Overview

1.1 Scope

1.2 Purpose

1.3 Background

1.4 Organization

1.5 Context

2. Normative references

3. Definitions, acronyms, and abbreviations

3.1 Definitions

3.2 Acronyms and abbreviations

4. Technology

4.1 Introduction

4.2 Serial access networks

4.3 On-chip instruments

5. Hardware architecture

5.1 Introduction to the IEEE 1687 network

5.2 Hierarchical IEEE 1687 networks

5.3 Controller

5.4 Instrument interface

5.5 Access network

5.6 Test data register

5.7 Local reset

5.8 Delivery and integration of instruments

5.9 Embedded TAP controller

5.10 Definitions of the structure of IEEE 1687 hardware architecture

5.11 Port functions of a module

5.12 Signals between and within IEEE 1687 modules

5.13 Components comprising a module

5.14 TAP finite state machine embedded in an IEEE 1687 module

5.15 Access network behavior

5.16 Plug-and-play interfaces

6. Instrument Connectivity Language (ICL)

6.1 ICL introduction

6.2 ICL overview

6.3 ICL lexical conventions and definitions

6.4 ICL primitive element keywords and statements

6.5 ICL informational statements

6.6 ICL connectivity

6.7 Inferring information in implicit ICL

6.8 Active values for control signals

7. Procedural Description Language (PDL): level-0

7.1 Purpose

7.2 PDL levels

7.3 Basic PDL concepts

7.4 Retargeting of PDL

7.5 PDL level-0 overview

7.6 PDL general rules

7.7 Generic PDL tokens

7.8 PDL numbers

7.9 PDL level-0 commands

8. Procedural Description Language: level-1 (Tcl)

8.1 Purpose

8.2 Tcl command extensions

8.3 PDL level-1 overview

8.4 PDL level-1 commands

8.5 PDL level-1 example

Annex A (informative) ICL grammar

A.1 Conventions

A.2 ICL language definition

Annex B (informative) PDL level-0 grammar

B.1 Conventions

B.2 Grammar

Annex C (informative) PDL level-1 grammar

Annex D (informative) PDL differences between IEEE Std 1687-2014 and IEEE Std 1149.1-2013

D.1 Introduction

D.2 PDL level-0 command differences

D.3 PDL level-1 commands

D.4 General operation differences

D.5 Creating interoperable PDL

Annex E (informative) Examples

E.1 Example context

E.2 Instrument example

E.3 Scan register example

E.4 Wrapped instrument example

E.5 Daisy-chain example

E.6 SIB_mux_pre component example

E.7 Single SIB example

E.8 Multiple SIB example

E.9 Scan muxes with local control example

E.10 Scan muxes with remote control example

E.11 Nested SIB example: mux_pre

E.12 BAD Nested SIB example: mux_post

E.13 Exclusive access example: implicit ICL

E.14 Exclusive access example: explicit ICL

E.15 Exclusive access with broadcast example

E.16 Broadcast or daisy-chain example

E.17 Branched scan chain example

E.18 Branched-then-merged scan chain example

E.19 IEEE 1500 wrapper serial port

E.20 IEEE 1500 WSP with SWIR bit included

E.21 Single embedded TAP controller (eTAPC) example

E.22 Basic PDL for a simple instrument

E.23 MBIST engine example

E.24 MBIST and associated memory example

E.25 Combined MBIST and memory example

E.26 Addressable instruments

E.27 Black-box module

E.28 Wide scan interface example

E.29 Simple IEEE 1149.1 AccessLink example

E.30 Complex IEEE 1149.1 AccessLink example

E.31 Generic AccessLink example

Annex F (informative) Design guidance

F.1 Introduction

F.2 Scan register implementations

F.3 Scan multiplexers

Annex G (informative) Bibliography

Back cover

IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device IEEE Computer Society Sponsored by the Test Technology Standards Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Std 1687™-2014 Authorized licensed use limited to: MobilePeak Holdings Ltd.. Downloaded on March 15,2016 at 07:27:10 UTC from IEEE Xplore. Restrictions apply.

Authorized licensed use limited to: MobilePeak Holdings Ltd.. Downloaded on March 15,2016 at 07:27:10 UTC from IEEE Xplore. Restrictions apply.

IEEE Std 1687™-2014 IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device Sponsor Test Technology Standards Committee of the IEEE Computer Society Approved 3 November 2014 IEEE-SA Standards Board Authorized licensed use limited to: MobilePeak Holdings Ltd.. Downloaded on March 15,2016 at 07:27:10 UTC from IEEE Xplore. Restrictions apply.

Abstract: A methodology for accessing instrumentation embedded within a semiconductor device, without defining the instruments or their features themselves, via the IEEE 1149.1™ test access port (TAP) and/or other signals, is described in this standard. The elements of the methodology include a hardware architecture for the on-chip network connecting the instruments to the chip pins, a hardware description language to describe this network, and a software language and protocol for communicating with the instruments via this network. Keywords: access network, built-in self-test (BIST), boundary scan, debug, design for testability (DFT), embedded instruments, IEEE 1149.1™, IEEE 1687™, Instrument Connectivity Language (ICL), internal JTAG (IJTAG), Joint Test Action Group (JTAG), on-chip instrumentation, Procedural Description Language (PDL), test, Tool Command Language (Tcl) • The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright © 2014 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 5 December 2014. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent & Trademark Office, owned by The Institute of Electrical and Electronics Engineers, Incorporated. PDF: Print: IEEE prohibits discrimination, harassment, and bullying. For more information, visit http://www.ieee.org/web/aboutus/whatis/policies/p9-26.html. No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher. ISBN 978-0-7381-9416-5 ISBN 978-0-7381-9417-2 STD20033 STDPD20033 Authorized licensed use limited to: MobilePeak Holdings Ltd.. Downloaded on March 15,2016 at 07:27:10 UTC from IEEE Xplore. Restrictions apply.

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Participants At the time this IEEE standard was completed, the IEEE 1687 Working Group had the following membership: Kenneth Posse, Chair Alfred Crouch, Vice Chair Jeff Rearick, Editor Michael Laisne, Webmaster Paul Abelovski Alan Bair Bill Bruce Krishna Chakravadhanula C. J. Clark Mike Coldewey Jean-Francois Cote Bruce Cowan Adam Cron Romi Datta Stylianos Diamantidis Jason Doege Richard Dugan Theodore Eaton Heiko Ehrenberg William Eklow Brian Foutz Pradipta Ghosh Kevin Gorman Suresh Goyal J. J. Grealish Scott Hartranft Hong-Shin Jun Rohit Kapur Martin Keim Bruno Latulippe Andrew Levy Guoqing Li Ed Malloy Harrison Miles, Jr. Skip Meyers Jay Nejedlo Thai-Minh Nguyen Hari Nookala Rick Nygaard Victor Orona John Parham Srinivas Patil Michele Portolan John Potter Jeff Remmers Paul Reuter Mike Ricchetti Ben Rice Thomas Rinderknecht Franciso Russi John Seibold Craig Stephan Anthony Suto Steven Terry Brian Turmelle William Tuthill Brad Van Treuren Hans Martin von Staudt Hugh Wallace Brian Wang Mike Wiznerowicz Christian Zoellin Songlin Zuo Copyright © 2014 IEEE. All rights reserved. vi Authorized licensed use limited to: MobilePeak Holdings Ltd.. Downloaded on March 15,2016 at 07:27:10 UTC from IEEE Xplore. Restrictions apply.

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