DDR验证和调试的高级方法.pdf-资料库

Validating and Debugging DDR2, DDR3 SDRAM Designs - Comprehensive Test solution from Analog to Digital Validation for All DDR Versions name title

Memory Design and Validation Chip/Component Design Precise understanding of circuit behavior under range of conditions Margin testing System Integration Signal integrity and timing analysis, discovery of issues under nominal conditions Debug interoperability issues Embedded Systems Easy test setup Quick pass/fail results 2 2010-4-26 Tektronix Innovation Forum 2010

DDR Test Challenges Signal Access & Probing – Easy-to-use / reliable connections – Bandwidth & Signal Integrity – Affordable Isolation of Read/Write bursts – Triggering or Post-Processing Complexity of JEDEC Conformance Tests – Parametric timing/amplitude measurements – Vref / Vih / Vil, Derating Results Validity / Statistics Effective Reporting / Archiving Advanced Analysis – Characterization – Debug 3 2010-4-26 Tektronix Innovation Forum 2010

Fast & Accurate instrument solutions DDR, DDR2 & DDR3 SDRAM Solutions Signal Path Characterization and Circuit Board Verification DSA Sampling Oscilloscopes Analog & Electrical Debug Digital Validation & Debug SDRAM Probing Solutions DPO/DSA real time scopes & software Verify correct design and circuit board performance Signal integrity measurements TLA Logic Analyzers with Nexus & FuturePlus Technology memory supports Verify and debug command sequence, timing, data, and more Easy and reliable physical connection with minimal loading 4 2010-4-26 Tektronix Innovation Forum 2010

Tektronix DDR Test Solutions Path Characterization & Circuit Board Verification Analog Validation & Debug Digital Validation & Debug DSA8200 sampling oscilloscope DSA70000 Probing and measurement Software TLA7000, Memory support and probing solutions DSA8200 sampling oscilloscope DSA70000 Probing and measurement Software TLA7000, Memory support and probing solutions DSA8200 sampling oscilloscope DSA70000 Probing and measurement Software TLA7000, Memory support and probing solutions DDR 266MHz 333MHz 400MHz DDR2 400MHz 533MHz 667MHz 800MHz 1066MHz DDR3 800MHz 1066MHz 1333MHz 1600MHz 1867MHz 5 2010-4-26 Tektronix Innovation Forum 2010

Problem: verify correct design and performance Path Characterization & Circuit Board Verification Characterize board/DIMM with TDR and S-Parameters Frequency-domain characterization of reflections and loss in a network Quantitative insight into the causes of signal integrity problems Measurements: Impedance measurements Insertion & Return Loss Frequency domain crosstalk transmissions path reflections Tx + - 1 t r o P + - Rcv + - 2 t r o P + - 6 2010-4-26 Tektronix Innovation Forum 2010

Verify correct design and circuit performance Path Characterization & Circuit Board Verification DSA8200 Sampling Oscilloscope with TDR and S-parameter generation software Performance Over 70GHz sampling bandwidth & lowest Jitter floor Improved impedance measurement accuracy and resolution (Z-Line) 1M record length enables measurements of long interconnects at higher frequency Efficiency & Simplicity Emulate channel effect on jitter & noise using TDR/TDT or S-parameter description Automated procedures minimize errors & reduce test time Complete analysis tasks in minutes not hours 7 2010-4-26 Tektronix Innovation Forum 2010

Tektronix DDR Test Solutions Path Characterization & Circuit Board Verification Analog Validation & Debug Digital Validation & Debug DSA8200 sampling oscilloscope DSA70000 Probing and measurement Software TLA7000, Memory support and probing solutions DSA8200 sampling oscilloscope DSA70000 Probing and measurement Software TLA7000, Memory support and probing solutions DSA8200 sampling oscilloscope DSA70000 Probing and measurement Software TLA7000, Memory support and probing solutions DDR 266MHz 333MHz 400MHz DDR2 400MHz 533MHz 667MHz 800MHz 1066MHz DDR3 800MHz 1066MHz 1333MHz 1600MHz 1867MHz 8 2010-4-26 Tektronix Innovation Forum 2010

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DDR验证和调试的高级方法.pdf

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