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STIL格式的仿真文件语法描述.pdf
IEEE-SA Standards Board
Introduction
Participants
Contents
1. Overview
1.1 Scope
1.2 Purpose
2. References
3. Definitions, acronyms, and abbreviations
3.1 Definitions
3.2 Acronyms and abbreviations
4. Structure of this standard
5. STIL orientation and capabilities tutorial
5.1 Hello Tester
5.1.1 STIL grammatical constructs
5.1.2 Complexity and language subsets
5.2 Basic LS245
5.3 STIL timing expressions/”Spec” information
5.4 Structural test (scan)
5.5 Advanced scan
5.5.1 Scan data merging
5.6 IEEE Std 1149.1-1990 scan
5.7 Multiple data elements per test cycle
5.7.1 Burst or pipelined data
5.7.2 Serial data
5.7.3 Multiple bit restrictions
5.8 Pattern reuse/direct access test
5.8.1 Background
5.9 Event data/non-cyclized STIL information
5.9.1 Pure event data
5.9.2 Mixed event and pattern data in STIL
5.9.3 Fully cyclized data
6. STIL syntax description
6.1 Case sensitivity
6.2 Whitespace
6.3 Reserved words
6.4 Reserved characters
6.5 Comments
6.6 Token length
6.7 Character strings
6.8 User-defined name characteristics
6.9 Domain names
6.10 Signal and group name characteristics
6.11 Timing name constructs
6.12 Number characteristics
6.13 Timing expressions and units (time_expr)
6.14 Signal expressions (sigref_expr)
6.15 WaveformChar characteristics
6.16 STIL name spaces and name resolution
7. Statement structure and organization of STIL information
7.1 Top-level statements and required ordering
7.2 Optional top-level statements
7.3 STIL files
8. STIL statement
8.1 STIL syntax
8.2 STIL example
9. Header block
9.1 Header block syntax
9.2 Header example
10. Include statement
10.1 Include statement syntax
10.2 Include example
10.3 File path resolution with absolute path notation
10.4 File path resolution with relative path notation
11. UserKeywords statement
11.1 UserKeywords statement syntax
11.2 UserKeywords example
12. UserFunctions statement
12.1 UserFunctions statement syntax
12.2 UserFunctions example
13. Ann statement
13.1 Annotations statement syntax
13.2 Annotations example
14. Signals block
14.1 Signals block syntax
14.2 Signals block example
15. SignalGroups block
15.1 SignalGroups block syntax
15.2 SignalGroups block example
15.3 Default attribute values
15.4 Translation of based data into WaveformChar characters
16. PatternExec block
16.1 PatternExec block syntax
16.2 PatternExec block example
17. PatternBurst block
17.1 PatternBurst block syntax
17.2 PatternBurst block example
18. Timing block and WaveformTable block
18.1 Timing and WaveformTable syntax
18.2 Waveform event definitions
18.3 Timing and WaveformTable example
18.4 Rules for timed event ordering and waveform creation
18.5 Rules for waveform inheritance
19. Spec and Selector blocks
19.1 Spec and Selector block syntax
19.2 Spec and Selector block example
20. ScanStructures block
20.1 ScanStructures block syntax
20.2 ScanStructures block example
21. STIL Pattern data
21.1 Cyclized data
21.2 Multiple-bit cyclized data
21.3 Non-cyclized data
21.4 Scan data
21.5 Pattern labels
22. STIL Pattern statements
22.1 Vector (V) statement
22.2 WaveformTable (W) statement
22.3 Condition (C) statement
22.4 Call statement
22.5 Macro statement
22.6 Loop statement
22.7 MatchLoop statement
22.8 Goto statement
22.9 BreakPoint statements
22.10 IDDQTestPoint statement
22.11 Stop statement
22.12 ScanChain statement
23. Pattern block
23.1 Pattern block syntax
23.2 Pattern initialization
23.3 Pattern examples
24. Procedures and MacroDefs blocks
24.1 Procedures block
24.2 Procedures example
24.3 MacroDefs block
24.4 Scan testing
24.5 Procedure and Macro Data substitution
Annex A
Annex B
Annex C
Annex D
Annex E
Annex F
IEEE Std 1450-1999
IEEE Standard Test Interface
Language (STIL) for Digital Test
Vector Data
Sponsor
Test Technology Standards Committee
of the
IEEE Computer Society
Approved 18 March 1999
IEEE-SA Standards Board
Abstract:
Standard Test Interface Language (STIL) provides an interface between digital test gen-
eration tools and test equipment. A test description language is defined that: (a) facilitates the trans-
fer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and
timing information sufficient to define the application of digital test vectors to a DUT; and (c) sup-
ports the volume of test vector data generated from structured tests.
Keywords:
automatic test pattern generator (ATPG), built-in self-test (BIST), computer-aided en-
gineering (CAE), cyclize, device under test (DUT), digital test vectors, event, functional vectors, pat-
tern, scan vectors, signal, structural vectors, timed event, waveform, waveshape
The Institute of Electrical and Electronics Engineers, Inc.
3 Park Avenue, New York, NY 10016-5997, USA
Copyright © 1999 by the Institute of Electrical and Electronics Engineers, Inc.
All rights reserved. Published 1 September 1999. Printed in the United States of America.
Print:
PDF:
ISBN 0-7381-1646-7 SH94734
ISBN 0-7381-1647-5 SS94734
No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior
written permission of the publisher.
IEEE Standards
documents are developed within the IEEE Societies and the Standards Coordinating Com-
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Introduction
(This introduction is not part of IEEE Std 1450-1999, IEEE Standard Test Interface Language (STIL) for Digital Test
Vector Data.)
Standard Test Interface Language (STIL) was initially developed by an ad-hoc consortium of test equipment
vendors, computer-aided engineering (CAE) and computer-aided design (CAD) vendors, and integrated cir-
cuit (IC) manufacturers, to address the lack of a common solution for transferring digital test data from the
generation environment to the test equipment.
The need for a common interchange format for large volumes of digital test data was identified as an overrid-
ing priority for the work; as such, the scope of the work was constrained to those aspects of the test environ-
ment that contribute significantly to the volume issue, or are necessary to support the comprehension of that
data. Binary representations of data were a key consideration in these efforts, resulting in a proposal to incor-
porate the compression of files as part of this standard.
Limiting the scope of any standards project is a difficult thing to do, especially for a room full of engineers.
However, issues that did not impact the scope as identified were dropped from consideration in this version
of the standard. Subclause 1.1 covers, specifically, the capabilities that are not intended to be part of this first
standard.
Early work in this consortium consisted of identifying the requirements necessary to address this problem
and reviewing existing options and languages in the industry. All options proposed fell short of addressing
the requirements, and the consortium started to define a new language. This work was executed with heavy
leverage from some existing languages and environments, and STIL owes much to the groundwork estab-
lished by these other languages.
Participants
When the STIL Working Group approved this standard, it had the following membership:
Greg Maston,
Tony Taylor,
Co-chair
Co-chair
The technical subgroup consisted of the following members:
Dave Dowding
Brady Harvey
Brad Hinckle
Larry Moran
Gary Murray
Chris Nelson
Don Organ
Mike Purtell
Jim Ward
Gregg Wilder
Other working group members were as follows:
Srinivas Ajjarapu
Phil Barch
Ajit Bhave
Fred Berneche
Joe Carbone
Don Denburg
Givargis A. Danialy
Tom Munns
Eric Parker
Frank Peyton
Gary Raines
Tim Wagner
Tom Williams
Peter Wohl
Stefan Zschiegner
Copyright © 1999 IEEE. All rights reserved.
iii
The following members of the balloting committee voted on this standard:
Phil Barch
Kenneth M. Butler
Joe Carbone
Donald Denburg
Dave Dowding
Grady Giles
Gary Ginn
Gary Hancock
Brady Harvey
Mitsuaki Ishikawa
Brion Keller
Fadi Maamari
Gregory A. Maston
Colin Maunder
Larry L. Moran
Tom Munns
Wayne Needham
Chris Nelson
Jim O’Reilly
Frank Peyton
Mike Purtell
Hira Ranga
Gordon Robinson
John W. Sheppard
William R. Simpson
Tony Taylor
Jon Udell
Jim Ward
Gregg Wilder
Peter Wohl
Stefan Zschiegner
The Working Group thanks those companies that contributed concepts and ideas to this effort, in addition to
people and time. These contributions helped to define the language presented in this standard. In particular,
the Working Group would like to thank: LTX Corporation, for providing information about the enVision
environment; Motorola, Incorporated, for providing information about the Universal Test Interface Code
(UTIC); Test Systems Strategies, Incorporated, for providing information about the Waveform Generation
Language (WGL); and Texas Instruments, Incorporated, for providing information about the Test Descrip-
tion Language (TDL).
When the IEEE-SA Standards Board approved this standard on 18 March 1999, it had the following
membership:
Richard J. Holleman,
Chair
Donald N. Heirman,
Vice Chair
Judith Gorman,
Secretary
Satish K. Aggarwal
Dennis Bodson
Mark D. Bowman
James T. Carlo
Gary R. Engmann
Harold E. Epstein
Jay Forster*
Ruben D. Garzon
**Member Emeritus
James H. Gurney
Lowell G. Johnson
Robert J. Kennelly
E. G. “Al” Kiener
Joseph L. Koepfinger*
L. Bruce McClung
Daleep C. Mohla
Robert F. Munzner
Louis-François Pau
Ronald C. Petersen
Gerald H. Peterson
John B. Posey
Gary S. Robinson
Akio Tojo
Hans E. Weinrich
Donald W. Zipse
Also included is the following nonvoting IEEE-SA Standards Board liaison:
Robert E. Hebner
Janet Rutigliano
IEEE Standards Project Editor
iv
Copyright © 1999 IEEE. All rights reserved.
Contents
1.
Overview.............................................................................................................................................. 1
2.
3.
4.
5.
1.1 Scope............................................................................................................................................ 3
1.2 Purpose......................................................................................................................................... 4
References............................................................................................................................................ 4
Definitions, acronyms, and abbreviations............................................................................................ 4
3.1 Definitions.................................................................................................................................... 4
3.2 Acronyms and abbreviations........................................................................................................ 7
Structure of this standard ..................................................................................................................... 7
STIL orientation and capabilities tutorial (informative)...................................................................... 8
5.1 Hello Tester.................................................................................................................................. 8
5.2 Basic LS245 ............................................................................................................................... 13
5.3 STIL timing expressions/”Spec” information............................................................................ 17
5.4 Structural test (scan) .................................................................................................................. 22
5.5 Advanced scan ........................................................................................................................... 26
5.6 IEEE Std 1149.1-1990 scan ....................................................................................................... 32
5.7 Multiple data elements per test cycle......................................................................................... 37
5.8 Pattern reuse/direct access test................................................................................................... 41
5.9 Event data/non-cyclized STIL information ............................................................................... 45
6.
STIL syntax description..................................................................................................................... 55
6.1 Case sensitivity .......................................................................................................................... 55
6.2 Whitespace................................................................................................................................. 55
6.3 Reserved words.......................................................................................................................... 55
6.4 Reserved characters ................................................................................................................... 57
6.5 Comments .................................................................................................................................. 58
6.6 Token length .............................................................................................................................. 58
6.7 Character strings ........................................................................................................................ 58
6.8 User-defined name characteristics ............................................................................................. 59
6.9 Domain names ........................................................................................................................... 59
6.10 Signal and group name characteristics....................................................................................... 60
6.11 Timing name constructs............................................................................................................. 60
6.12 Number characteristics............................................................................................................... 60
6.13 Timing expressions and units (time_expr)................................................................................. 61
6.14 Signal expressions (sigref_expr)................................................................................................ 63
6.15 WaveformChar characteristics................................................................................................... 64
6.16 STIL name spaces and name resolution..................................................................................... 65
7.
Statement structure and organization of STIL information ............................................................... 67
7.1 Top-level statements and required ordering .............................................................................. 68
7.2 Optional top-level statements .................................................................................................... 70
7.3 STIL files ................................................................................................................................... 70
Copyright © 1999 IEEE. All rights reserved.
v
8.
STIL statement................................................................................................................................... 70
8.1 STIL syntax................................................................................................................................ 70
8.2 STIL example............................................................................................................................. 70
9.
Header block ...................................................................................................................................... 71
9.1 Header block syntax................................................................................................................... 71
9.2 Header example ......................................................................................................................... 71
10.
Include statement ............................................................................................................................... 71
10.1 Include statement syntax............................................................................................................ 72
10.2 Include example ......................................................................................................................... 72
10.3 File path resolution with absolute path notation ........................................................................ 72
10.4 File path resolution with relative path notation ......................................................................... 72
11.
UserKeywords statement ................................................................................................................... 73
11.1 UserKeywords statement syntax................................................................................................ 73
11.2 UserKeywords example ............................................................................................................. 73
12.
UserFunctions statement.................................................................................................................... 73
12.1 UserFunctions statement syntax ................................................................................................ 74
12.2 UserFunctions example.............................................................................................................. 74
13.
Ann statement .................................................................................................................................... 74
13.1 Annotations statement syntax .................................................................................................... 74
13.2 Annotations example ................................................................................................................. 74
14.
Signals block...................................................................................................................................... 74
14.1 Signals block syntax .................................................................................................................. 75
14.2 Signals block example ............................................................................................................... 77
15.
SignalGroups block............................................................................................................................ 77
15.1 SignalGroups block syntax ........................................................................................................ 77
15.2 SignalGroups block example ..................................................................................................... 78
15.3 Default attribute values .............................................................................................................. 78
15.4 Translation of based data into WaveformChar characters......................................................... 79
16.
PatternExec block .............................................................................................................................. 80
16.1 PatternExec block syntax........................................................................................................... 81
16.2 PatternExec block example........................................................................................................ 81
17.
PatternBurst block.............................................................................................................................. 81
17.1 PatternBurst block syntax .......................................................................................................... 82
17.2 PatternBurst block example ....................................................................................................... 83
vi
Copyright © 1999 IEEE. All rights reserved.
18.
Timing block and WaveformTable block .......................................................................................... 83
18.1 Timing and WaveformTable syntax .......................................................................................... 84
18.2 Waveform event definitions....................................................................................................... 87
18.3 Timing and WaveformTable example ....................................................................................... 89
18.4 Rules for timed event ordering and waveform creation............................................................. 90
18.5 Rules for waveform inheritance................................................................................................. 93
19.
Spec and Selector blocks ................................................................................................................... 94
19.1 Spec and Selector block syntax.................................................................................................. 94
19.2 Spec and Selector block example .............................................................................................. 96
20.
ScanStructures block.......................................................................................................................... 97
20.1 ScanStructures block syntax ...................................................................................................... 98
20.2 ScanStructures block example ................................................................................................... 99
21.
STIL Pattern data ............................................................................................................................. 100
21.1 Cyclized data............................................................................................................................ 100
21.2 Multiple-bit cyclized data ........................................................................................................ 101
21.3 Non-cyclized data .................................................................................................................... 102
21.4 Scan data .................................................................................................................................. 102
21.5 Pattern labels............................................................................................................................ 103
22.
STIL Pattern statements................................................................................................................... 103
22.1 Vector (V) statement................................................................................................................ 103
22.2 WaveformTable (W) statement................................................................................................ 104
22.3 Condition (C) statement........................................................................................................... 104
22.4 Call statement........................................................................................................................... 105
22.5 Macro statement....................................................................................................................... 105
22.6 Loop statement......................................................................................................................... 106
22.7 MatchLoop statement............................................................................................................... 106
22.8 Goto statement ......................................................................................................................... 107
22.9 BreakPoint statements.............................................................................................................. 107
22.10 IDDQTestPoint statement...................................................................................................... 107
22.11 Stop statement........................................................................................................................ 108
22.12 ScanChain statement.............................................................................................................. 108
23.
Pattern block .................................................................................................................................... 108
23.1 Pattern block syntax................................................................................................................. 108
23.2 Pattern initialization ................................................................................................................. 109
23.3 Pattern examples ...................................................................................................................... 109
24.
Procedures and MacroDefs blocks................................................................................................... 109
24.1 Procedures block...................................................................................................................... 110
24.2 Procedures example ................................................................................................................. 111
24.3 MacroDefs block...................................................................................................................... 111
24.4 Scan testing .............................................................................................................................. 111
24.5 Procedure and Macro Data substitution................................................................................... 112
Copyright © 1999 IEEE. All rights reserved.
vii
Annex A (informative) Glossary ................................................................................................................. 116
Annex B (informative) STIL data model..................................................................................................... 117
Annex C (informative) GNU GZIP reference ............................................................................................. 122
Annex D (informative) Binary STIL data format ........................................................................................ 123
Annex E (informative) LS245 design description ...................................................................................... 127
Annex F (informative) STIL FAQs and language design decisions............................................................ 129
viii
Copyright © 1999 IEEE. All rights reserved.
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