Testing Embedded Software.pdf

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8560 Prelims (i-xviii) 10/10/02 1:46 pm Page i Testing Embedded Software

8560 Prelims (i-xviii) 10/10/02 1:46 pm Page ii

8560 Prelims (i-xviii) 10/10/02 1:46 pm Page iii Bart Broekman and Edwin Notenboom Testing Embedded Software An imprint of PEARSON EDUCATION London · Boston · Indianapolis · New York · Mexico City · Toronto · Sydney · Tokyo · Singapore Hong Kong · Cape Town · New Delhi · Madrid · Paris · Amsterdam · Munich · Milan · Stockholm

8560 Prelims (i-xviii) 10/10/02 1:46 pm Page iv London Ofﬁce 128 Long Acre London WC2E 9AN Tel: +44 (0)20 7447 2000 Fax: +44 (0)20 7447 2170 PEARSON EDUCATION LIMITED Head Ofﬁce Edinburgh Gate Harlow CM20 2JE Tel: +44 (0)1279 623623 Fax: +44 (0)1279 431059 Website: www.it-minds.com www.aw.professional.com First Published in Great Britain in 2003 © Sogeti Nederland, 2003 The right of Bart Broekman and Edwin Notenboom to be identiﬁed as the Authors of this work has been asserted by them in accordance with the Copyright, Designs and Patents Act 1988. ISBN 0 321 15986 1 British Library Cataloguing in Publication Data A CIP catalogue record for this book is available from the British Library. Library of Congress Cataloging in Publication Data Applied for. All rights reserved. No part of this publication may be reproduced, stored in a retrieval system, or transmitted in any form or by any means, electronic, mechanical, photocopying, recording, or otherwise without either the prior written permission of the Publishers or a licence permitting restricted copying in the United Kingdom issued by the Copyright Licensing Agency Ltd, 90 Tottenham Court Road, London W1T 4LP. This book may not be lent, resold, hired out or otherwise disposed of by way of trade in any form of binding or cover other than that in which it is published, without the prior consent of the Publishers. Approval has been obtained from ETAS GmbH, Stuttgart, to use the pictures that they provided. TMap® is a registered trademark of Sogeti Nederland BV. 10 9 8 7 6 5 4 3 2 1 Typeset by Pantek Arts Ltd, Maidstone, Kent. Printed and bound in Great Britain by Biddles Ltd, Guildford and King’s Lynn. The Publishers’ policy is to use paper manufactured from sustainable forests.

8560 Prelims (i-xviii) 10/10/02 1:46 pm Page v Contents Foreword Preface Acknowledgments Part I Introduction 1 Fundamentals Aims of testing 1.1 1.2 What is an embedded system? 1.3 Approach to the testing of embedded systems 2 The TEmb method 2.1 2.2 2.3 Mechanism for assembling the dedicated test approach Overview TEmb generic Part II Lifecycle 3 Multiple V-model 3.1 3.2 3.3 Introduction Test activities in the multiple Vs The nested multiple V-model 4 Master test planning 4.1 4.2 Elements of master test planning Activities x xiii xvi xix 3 3 5 6 7 7 10 15 21 25 25 27 29 33 33 37

8560 Prelims (i-xviii) 10/10/02 1:46 pm Page vi vi Testing Embedded Software 5 6 Testing by developers 5.1 5.2 5.3 Introduction Integration approach Lifecycle Testing by an independent test team 6.1 6.2 6.3 6.4 6.5 6.6 Introduction Planning and control phase Preparation phase Speciﬁcation phase Execution phase Completion phase Part III Techniques 7 Risk-based test strategy 7.1 7.2 7.3 7.4 7.5 7.6 Introduction Risk assessment Strategy in master test planning Strategy for a test level Strategy changes during the test process Strategy for maintenance testing 8 9 Testability review 8.1 8.2 Introduction Procedure Inspections 9.1 9.2 Introduction Procedure 10 Safety analysis 10.1 Introduction 10.2 Safety analysis techniques 10.3 Safety analysis lifecycle 11 Test design techniques 11.1 Overview 11.2 State transition testing 45 45 46 50 55 55 55 64 66 69 72 75 79 79 80 82 85 90 91 95 95 95 99 99 100 103 103 104 109 113 113 121

8560 Prelims (i-xviii) 10/10/02 1:46 pm Page vii Contents vii 11.3 Control ﬂow test 11.4 Elementary comparison test 11.5 Classiﬁcation-tree method 11.6 Evolutionary algorithms 11.7 Statistical usage testing 11.8 Rare event testing 11.9 Mutation analysis 12 Checklists 12.1 Introduction 12.2 Checklists for quality characteristics 12.3 General checklist for high-level testing 12.4 General checklist for low-level testing 12.5 Test design techniques checklist 12.6 Checklists concerning the test process Part IV Infrastructure 13 Embedded software test environments 13.1 Introduction 13.2 First stage: simulation 13.3 Second stage: prototyping 13.4 Third stage: pre-production 13.5 Post-development stage 14 Tools 14.1 Introduction 14.2 Categorization of test tools 15 Test automation 15.1 Introduction 15.2 The technique of test automation 15.3 Implementing test automation 16 Mixed signals Mirko Conrad and Eric Sax 16.1 Introduction 16.2 Stimuli description techniques 16.3 Measurement and analysis techniques 134 138 144 151 158 165 166 169 169 169 175 176 177 178 189 193 193 195 199 205 207 209 209 210 217 217 218 222 229 229 234 245

8560 Prelims (i-xviii) 10/10/02 1:46 pm Page viii viii Testing Embedded Software Part V Organization 17 Test roles 17.1 General skills 17.2 Speciﬁc test roles 18 Human resource management 18.1 Staff 18.2 Training 18.3 Career perspectives 19 Organization structure 19.1 Test organization 19.2 Communication structures 20 Test control 20.1 Control of the test process 20.2 Control of the test infrastructure 20.3 Control of the test deliverables Part VI Appendices Appendix A Risk classiﬁcation Appendix B Statecharts B.1 B.2 B.3 B.4 B.5 B.6 States Events Transitions Actions and activities Execution order Nested states Appendix C Blueprint of an automated test suite C.1 C.2 C.3 C.4 C.5 C.6 Test data Start Planner Reader Translator Test actions 251 255 255 256 265 265 267 268 273 273 277 279 279 284 286 291 293 295 295 296 297 297 298 299 301 301 302 302 303 304 304

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