Keysight Technologies
JULY 23, 2018
王文斌
wenbin.wang@keysight.com
➢ 5G时代PA的技术趋势
➢ PA射频特性测试
➢ PA系统级指标测试
➢ PA自动化验证
2
B R O A D R A N G E O F N E W S E R V I C E S A N D C O N N E C T I V I T Y P A R A D I G M S
Courtesy of METIS: 2014
Enhanced Mobile
Broadband (eMBB)
Ultra Reliability and Low
Latency (URLLC)
Massive Machine
Communication (mMTC)
• All data, all the time
• 2 billion people
on social media
• Ultra high-reliability
• 30 billion “things” connected
• Ultra-low latency
• Low cost, low energy
3GPP Rel-15 coverage
3
4
•
•
The BF module not only integrates the active antenna array to realize
beamforming, but also enables frequency conversion for both uplink
and downlink
converting the mmWave frequency to the IF frequency directly and
immediately on a BF module minimizes the front-end insertion loss
z
H
G
6
-
b
u
s
Application
Processor
(AP)
BaseBand IC
(BB-IC)
w
m
m
Application
Processor
(AP)
BB & RFIC
IQ
IF
RF Transceiver
(RF-IC)
PA/FEM
Phased-array
Transceiver IC
• From IEEE Document 5G Cellular User Equipment: From Theory to Practical Hardware Design 19 Jul2017
5
Industry Challenge
W I D E B A N D W I D T H S F O R H I G H D A T A T H R O U G H P U T C R E A T E S N E W I S S U E S
5G Industry Drivers
Move to cm & mmWave for more bandwidth
Massive growth in
demand for mobile data
100 GHz emerging 5G research
Up to 5 GHz BW for 5G signals
0
10
20
30
40
50
60
70
80
90
100
GHz
Design and measurement challenges
Challenging very wideband mmWave measurements
• Phase noise, IQ & freq response errors worse at mmW
• Wide bandwidth means more noise, more spurs, worse EVM
6
Base Station
Handset
IoT Device
各种半导体技术都将有一席之地
Application
/Technology
GaAs HBT
GaAs HEMT
InP HBT
GaN HEMT
☺
SiGe(BiCMOS)
CMOS,Si SOI
Sub-
6GHz
mmW
Sub-
6GHz
☺
☺
☺
mmW
☺
☺
Sub-
6GHz
☺
☺
mmW
☺
☺
▪ 基站:高压&性能驱动,高 Vdd —— GaN HEMT
▪ 终端:效率驱动——HBT&HEMT
▪ 物联网:成本——SiGe & CMOS
7
• 多制式、多功能——测试项目繁复
• 应用速度(研发到交付)——研发与产测结果一致性验证
• 单元电路间的协同——基本指标与系统级指标同时关注
We’re here
更好的性能
ET/DPD, Noise Figure
一体化的设计
测试项目更加复杂
更多的频段
10倍以上的测试项目
宽带应用
mmW和宽带测试带来的挑战
更高的集成度
在片测试
先进的封装
OTA测试
基本参数测试
EVM, Channel power, ACP,
IM3, Harmonics, Gain,
Isolations, Matching, etc.
8