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- -- - -- - -- ----- Ilill~.2~ 1IIIlJ·~ I:lt~~, ~iCROCOf'Y RESOLUTION TES1 Ch,;RT

Ordering No.: NPRD~91 I\T(()l\fELEt~~K~I:t()l~X~~ Il.f~1t~lr§ lf~.EL].j~I8)KLI1'1Y nP\'lf}\ J1991 Prepared by: William L'enson, Greg Chandler, \Afilliam Crowell, &. Rick Wanner Reliability Analysis Center PO Dox4700 Rome, NY 13'140-8200 Under contract to: Rome Laboratory Gnffiss AFB, NY 13441-5700 '" ., i C ".,:,;c. '''"1' r I'rrr II . ..,.. if'.

The Rel'ability Analysis Center (RAC) Is a Department of Defense Information Analysis Center sponsored by the Defenr.e Technical Information Center, managed by' the Rome Laboratory (formerly RADC), and operated by lIT Research Institute (IITRD. RAC is chartered to collect, analyze and disseminate reliability information pertaining to systems and parts used therein. The present scope includes integrated circuits, hybrids, discrete semiconductors, microwave devices, optoelectronics and nonelectronic parts employed in military, space, the reliability activities include the related disciplines of Maintalnabllity, Testability, Stiltistic.tl Process Control, Electrostatic Discharge, and Total Quality Management. industrial and commercial applications. The scope of The data contained in the RAe databases Me collected on a continuous basis (mID a broad range of sources, including testing laboratories, device and equipment rnanafacturers, government laboratories. and equipment users (government and industry), Automatic distribution lists, voluntary data submittals and field failure reporting systems supplement an intensive data solicttatlor. program. Users of RAe data nrc encouraged to submit reliabillty data to RILe to enha nee these data collection efforts. Peliability data and analysis documents covering most of the device types mentioned above are available from the RAe. Also, RAC provides reliability consulting, training, technic... I and blbllographlc inquiry services which are noted at the end of this document. REQUEST FOR TECHNICAL ASSISTANCE AND IlWORMATION ON AVAILA13LE RAC SERVICES AND PUBLICATIONS MAY BE DIRECTED TO: Rellability Analysis Center P.O. Box 4700 Rom », NY 13440-8200 TQM Inquiries: Non-Technical Inquiries: Technical Inquiries: Tdr.Fax: (BOO) 526-'18U4 (315) 330-41!)1 (315) 337·0900 (315) 337-9933 (:n5) 337-9932 ALL OTHER REQUESTS SHOULD SE DIRECTED TO: H01\1~ Laboratory RIWJDuilue A. Gilmour Grif.fiss AFB,NY 134,11-5700 Telephone: A utovon: (315) 330-2540 587·2540 e 1991, lIT Research Institute AI! Rights Reservel • ii

.. --- ----.~-~--=r---~--. Form Approvod OMS No. 0'/04-01SO FIEPORT ')OCUM~I\JTATION PAGE piJ'5iiCi'O )or~ng ::JUrden rotiFiTs aiiiii'Cticiiiof Informavon :. ostlmall<1 to averaoG 1 hC'Jt pill lllsponse,lngoil"' e llme fa; lllVlovTn;, Thstn20nl, &e3r~hinfj~ data S.:lU cos,gathedn;) MIlmaintaining thodataneeced, andcomp!l)ling endro\iowl/1iJ the eo!lect'on of 'nf",maron. Sondcomments regnrc.lng!hi. bwdon estimate cr tiny oJ1fi aspectof !hIscol'octi,," of Inlormation, Ir'eluding suggestions for roduclng thIs bU'd&;'\, to W.l~hlr~toll lltllldqu:ut&rll SOrv\cos, [)irocl' 'OIG for InforiT\.l~on Ooeraticns and /toperts, 1215,'oflarsonOa\i3lfgtrNay, Suito1204,Arlir.g:/)n, VA 22202·4302,andto tho Ofh:fI .:' MiIllagomont andOud~el. Papcrwor'~ neduction !?:~tj£.704·0t88), was!0.~!!~~_______ _ ._ UGE=SE ONLY ;CO.1VO 81:__.1:~~:;19::=I3.~=-TYI'EMD DA~ES ~VERED 4.TITLE AND SUBTITLE Noneloctronlc Paris Reliability Data 1991 _____ •• ~h _ 6.AUTHOH(S) William uenson, Greg Chandler, William crowej. Rick Wanner 5. FUNDING NUMiJERS 658028 --------~-------i 7PERFORM"iNG7JRGANIZATION IMME(S) AND ADDi1I::<.ffi(ES) Reliability Analysts Centcr PO Box 4700 Ramo, NY 13440·8200 ---~-I~O-.......P=ERf6m:~ING ORGANll.ATi[JN-- REPORT NIJMOER NPRD·91 9.SPONSORING/MONITORING f,GENC~' NAMr:fs) ANDJ\DDRESS(ES) OTIC. Cameron Station Ale.

tcchnloal YM Informat/on and dGta contetncd horoln Itavo been co",!'IIt3d frorl" govornmont and nonqovornmont reports and from rMh,lrlal nupptlcd by varloua manufacturers and uro mtonded to be uaGd~or rotarenco purposoe. Nolther tho Unitod stntos Oovlunmont nor liT R0301HCh Instltuto wnrrtmt tho accuracy of Ihl3 Intorrneucn and dstc. Tho user 10 turtncr cnuuoncd Ihat tho data contained nerotnmnyClol bo ulJod In IIGU of other con:mclunlly cllod rotcrencca L"d GPoclrlcflllono. Put'llcatlon of this Informallon Is not an expresalon of tiH) opinion of 1"'0 Unltud Stato!» Govornmont or of liT Roooarch InDtitulo l.'JJ to tho quolily or durability or orr)' product mennoncd horoln and any UIlt) tor lld~'ortltllnrJ UI' promotional purpoaea of th!' tntormntlon In ccnjuncuon with tho namo (If Tho lJrlllod StatoD ()ovornmllnt or 111' AU90nrch InOliluto without written pormilu'IQn 10 oxproasly prohtblteo. iv

PIrlJlIACfi Tt is document con talns field failure rr.te data on a vat lety of electrical, mechanica I, el-rctrornecltanlcal, and microwave paris anti fjss~mblll~:3. 11115 data can be used to assist in performance 0' reliability analyses. !'IPRD·91 contains 4 times Ihe amount of; nformaticn presented In Its predecessor, NPRD-3 and presents f iilure data from 1,400 different part typis, Throughout this document, data is grouped as a function of the spcciflc part type, quality level, "J.pllcatiou cr.vironmcnt, and data source. Data was collected .rorn a wide variety of commercial and military 30Ul ces. Over 4,800 failure rate entries are presented in the 5l;mmarysection of this document, Many improvements have been rrade since the publication of Nt"RD-3. In addition to the inclusion of more data entries ami detnils on each part, a comprehensive 'l'.l'jt index Is provided 10assist the user in identifying and locating part types of interest. Section 6 of thin document contains the user manual (or the optional PC-Dased data access software available a!. a s cparate product. Tht PC-Dased softwarecombines part summary, part detail, index, and data scurce information Into a qUl'lYdriven integrr."':d tool. The authors would like to express tlu.ir sincere apprcclatlon to those who contributed their time and effort to the preparation of this publlc.ulon including Debblo Canning, Jill Race, Shirley Thomson, and Jeanne Crowell. Additionally, constructive direction ,','/as provided by the RAC's Technical A~vlsory Group crAG) and the Senior Advisory Board. ._/-_.-. ... "- ....! , , UTl!}."l~l"'''· 'J I'.. ,,:'. ~ Jus t 11' , I.··:'l t ~.Ii. ---_.__ .__ ....-----....... _.. Dy__.__..•...... . _ ~~~! r-t o»: ~1II'1 _ A....~l_l ..'t 1.1 ' I ' e.JI"jDB Diet ~rJ"'c LI1 * fA -,. -.l il:1'~/or , ~LL__., v

SECTION 1 TABU! or CONTENTS IN YRODUCTION 1.0 BACKGROUND 1.1 DATACOLLECl10N 1.2 DATA INTEHPRETATION 1.~1 1.4 DOCUMENT OVmWIEW ENHANCF.Ml'iNTS SINCE NPRD-3 1.4.1 .1.4.2 1.4.3 1.·1.4 1.4.5 SECTION 2 OVERVIEW SECTION 3 OVERVIEW SELliON 4 OVERVIEW BECTION 5 OVERVIEW SECTION 6 OVERVIEW SECTION 2 '!'ART SIJMMARIES SECTION 3 PART D.~TAIlS SECTION 4 PART INDEX SECTiON 5 DATA SOURCES SECTION 6 PC USER MANUAL 6.P 6.1 INTRODUCTION SOFrWARE USAGE INSTRUCTIONS 6.1.1 ML.\JIMUM SYSTEM REQUIREMENTS 6.1.2 SOFTWME USERS' AGREEMENT 6.1.3 LI.MITED WARRANfY 6.1.4 PA.CKAGE CONlENTS INSTALLATION 6.2 6.3 OPERATION 6.3.1 r'ERFORMING SEARCHES 6.3.2 GENERATING REPORTS 6.3.3 APPLICATION ENVIRONMENT DISPLAY PERFOEMANCE NOTES. 6.4.1 FACTORS INFORM'IX INSTALL NOTES 6.4 6.5 LISTOF1fADLES TABLE 1-1 TABLE 1-2 TABLE 1-3 TABLE 1-4 TABLE 1-S TABLE 1·6 TABLE 6·1 TABLE 6·2 TABLE 6-3 TABLE 6-4 DATA SUMMAIUZAnaN PROCEDURE TIME AT WHIO-I ASYMPTOTIC VALUE IS REACHED a/MTIF RATIO ASA FUNCTION OF P HELD DESCRIJYflONS APPLICATION ENVIRONMENTS PERCENT FAILURES FOR WEIBULL D1STRlBUTIONS MAIN MENU OP110NS PC SYSTEM FIELD DEFINITIONS PC SYSTEM - DETAIL FIELD DESCRIP110NS EXAMPLE ENVIRONMENT SPACE SETTINGS vii fuQ 1-1 1~1 1-3 1·6 1-9 1-10 1·10 1-16 1-20 1-20 1-20 2-1 3-1 4-1 5-1 6-1 6-1 6-1 6-1 6-1 6-2 6-2 6~3 6-6 6-7 6·10 6-11 6-12 6-12 6-13 1-4 1-8 1-8 1-12 t-ia 1·17 6-6 6·7 6-10 6·13

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