MLC e·MMC™ and Mobile LPDDR3
221-Ball MCP
Features
Part Numbering Information
Device Marking
MCP General Description
Ball Assignments
Ball Descriptions
Device Diagrams
Package Dimensions
8GB e·MMC™ Memory
CID Register
OCR Register
CSD Register
ECSD Register
e.MMC Performance and Current Consumption
Architecture
MMC Protocol Independent of NAND Flash Technology
Defect and Error Management
State Diagrams
Electrical Specifications
e.MMC Electrical Specifications
LPDDR3 Electrical Specifications
DC Electrical Specifications – Device Power
8Gb: x16, x32 Mobile LPDDR3 SDRAM
Features
LPDDR3 Array Configuration
LPDDR3 MR0, MR5, MR6, MR8 Readout
IDD Specifications – Single Die
Functional Description
Simplified Bus Interface State Diagram
Power-Up and Initialization
Voltage Ramp and Device Initialization
Initialization After Reset (Without Voltage Ramp)
Power-Off Sequence
Uncontrolled Power-Off Sequence
Standard Mode Register Definition
Mode Register Assignments and Definitions
Commands and Timing
ACTIVATE Command
8-Bank Device Operation
Read and Write Access Modes
Burst READ Command
tDQSCK Delta Timing
Burst WRITE Command
Write Data Mask
PRECHARGE Command
Burst READ Operation Followed by PRECHARGE
Burst WRITE Followed by PRECHARGE
Auto Precharge
Burst READ with Auto Precharge
Burst WRITE with Auto Precharge
REFRESH Command
REFRESH Requirements
SELF REFRESH Operation
Partial-Array Self Refresh (PASR) – Bank Masking
Partial-Array Self Refresh – Segment Masking
MODE REGISTER READ
MRR Following Idle Power-Down State
Temperature Sensor
DQ Calibration
MODE REGISTER WRITE
MRW RESET Command
MRW ZQ Calibration Commands
ZQ External Resistor Value, Tolerance, and Capacitive Loading
MRW – CA Training Mode
MRW - Write Leveling Mode
On-Die Termination (ODT)
ODT Mode Register
Asychronous ODT
ODT During READ Operations (READ or MRR)
ODT During Power-Down
ODT During Self Refresh
ODT During Deep Power-Down
ODT During CA Training and Write Leveling
Power-Down
Deep Power-Down
Input Clock Frequency Changes and Stop Events
Input Clock Frequency Changes and Clock Stop with CKE LOW
Input Clock Frequency Changes and Clock Stop with CKE HIGH
NO OPERATION Command
Truth Tables
Absolute Maximum Ratings
Input/Output Capacitance
Electrical Specifications – IDD Measurements and Conditions
IDD Specifications
AC and DC Operating Conditions
AC and DC Logic Input Measurement Levels for Single-Ended Signals
VREF Tolerances
Input Signal
AC and DC Logic Input Measurement Levels for Differential Signals
Single-Ended Requirements for Differential Signals
Differential Input Crosspoint Voltage
Input Slew Rate
Output Characteristics and Operating Conditions
Single-Ended Output Slew Rate
Differential Output Slew Rate
HSUL_12 Driver Output Timing Reference Load
Output Driver Impedance
Output Driver Impedance Characteristics with ZQ Calibration
Output Driver Temperature and Voltage Sensitivity
Output Impedance Characteristics Without ZQ Calibration
ODT Levels and I-V Characteristics
Clock Specification
tCK(abs), tCH(abs), and tCL(abs)
Clock Period Jitter
Clock Period Jitter Effects on Core Timing Parameters
Cycle Time Derating for Core Timing Parameters
Clock Cycle Derating for Core Timing Parameters
Clock Jitter Effects on Command/Address Timing Parameters
Clock Jitter Effects on Read Timing Parameters
Clock Jitter Effects on Write Timing Parameters
Refresh Requirements
AC Timing
CA and CS_n Setup, Hold, and Derating
Data Setup, Hold, and Slew Rate Derating
Revision History
Rev. A – 03/16